C8051F350-TB Silicon Laboratories Inc, C8051F350-TB Datasheet - Page 44
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C8051F350-TB
Manufacturer Part Number
C8051F350-TB
Description
PROTOTYPINGBOARDWITH C8051F350
Manufacturer
Silicon Laboratories Inc
Type
MCUr
Specifications of C8051F350-TB
Contents
Board
Processor To Be Evaluated
C8051F35x
Interface Type
USB
Silicon Manufacturer
Silicon Labs
Core Architecture
8051
Silicon Core Number
C8051F350
Silicon Family Name
C8051F35x
Kit Contents
Board
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
For Use With/related Products
C8051F350
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
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C8051F350/1/2/3
5.2.
Calibrating the ADC
ADC0 can be calibrated in-system for both gain and offset, using internal or system calibration modes. To
ensure calibration accuracy, offset calibrations must be performed prior to gain calibrations. It is not neces-
sary to perform both internal and system calibrations, as a system calibration will also compensate for any
internal error sources.
Offset calibration is a single-point measurement that sets which input voltage produces a zero at the ADC
output. When performing an offset calibration, any deviation from zero in the measurement is stored in the
offset register. The offset value is subtracted from all conversions as they take place.
Gain calibration is a two-point measurement that sets the slope of the ADC transfer function. When per-
formed, a gain calibration takes only a single measurement, which is assumed to be the desired full-scale
value in the ADC transfer function. The offset calibration value is used as the other point in the gain calibra-
tion measurement, so that a gain factor can be calculated. After offset correction, conversions are multi-
plied by the gain factor.
Calibrations are initiated by writing the ADC System Mode bits (AD0SM) to one of the calibration options.
During a calibration, the AD0CBSY bit is set to ‘1’. Upon completion of a calibration the the AD0SM bits will
return to Idle mode, the AD0CBSY bit will be cleared to ‘0’, the AD0CALC bit will be set to ‘1’, and an ADC
interrupt will be generated. Calibration results are also written to the appropriate calibration registers when
the calibration is complete.
5.2.1. Internal Calibration
Internal calibration is performed without requiring a specific voltage on the ADC input pins. Internal calibra-
tions can be performed in three different ways: offset only, gain only, or full (offset and gain). A full internal
calibration consists of an internal offset calibration followed by an internal gain calibration. If offset and gain
calibrations are performed independently, offset calibration must be performed prior to gain calibration.
During an internal offset calibration, the ADC inputs are connected internally to AGND. For an internal gain
calibration, the ADC inputs are connected internally to a full-scale Voltage that is equal to the selected Volt-
age reference divided by the PGA gain.
5.2.2. System Calibration
System calibration is performed using voltages which are applied to the ADC inputs. There are two system
calibration options: offset calibration and gain calibration. For accurate calibration results, offset calibration
must be performed prior to gain calibration. During a system offset calibration, the ADC inputs should be
connected to a “zero” value. During a system gain calibration, the ADC inputs should be connected to the
positive full-scale value for the current PGA gain setting.
5.2.3. Calibration Coefficient Storage
The calibration results for offset and gain are each 24-bits long. The calibration results are stored in SFRs
that are both readable and writeable from software. This enables factory calibrations, as well as manual
modification of the offset and gain parameters. The offset calibration results are stored as a two’s comple-
ment, 24-bit number in the ADC0COH, ADC0COM, and ADC0COL registers. The mapping of the offset
register is shown in Figure 5.3. The gain calibration results are stored as a fixed-point, 24-bit number in the
ADC0CGH, ADC0CGM, and ADC0CGL registers. The mapping of the gain register is shown in Figure 5.4.
44
Rev. 1.1
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