SI3056PPT3-EVB Silicon Laboratories Inc, SI3056PPT3-EVB Datasheet - Page 83
SI3056PPT3-EVB
Manufacturer Part Number
SI3056PPT3-EVB
Description
BOARD EVAL FOR DAA SI3056/SI3008
Manufacturer
Silicon Laboratories Inc
Specifications of SI3056PPT3-EVB
Main Purpose
Telecom, Data Acquisition Arrangement (DAA)
Utilized Ic / Part
Si3056
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Secondary Attributes
-
Embedded
-
Primary Attributes
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant
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A
Although designs using the Si3056 comply with the
UL1950 3rd edition and pass all overcurrent and
overvoltage tests, there are still several issues to
consider.
Figure 37 shows two designs that can pass the UL1950
overvoltage tests and electromagnetic emissions. The
top schematic shows the configuration in which the
ferrite beads (FB1 and FB2) are on the unprotected side
of the sidactor (RV1). For this configuration, the current
rating of the ferrite beads needs to be 6 A. However, the
higher current ferrite beads are less effective in
reducing electromagnetic emissions.
PPENDIX
—UL1950 3
600 Ω at 100 MHz, 200 mA
600 Ω at 100 MHz, 200 mA
RV1
Figure 37. Circuits that Pass all UL1950 Overvoltage Tests
FB1
FB2
RD
E
DITION
Rev. 1.05
RV1
The bottom schematic of Figure 37 shows the
configuration in which the ferrite beads (FB1 and FB2)
are on the protected side of the sidactor (RV1). For this
design, the ferrite beads can be rated at 200 mA.
In a cost-optimized design, compliance to UL1950 does
not always require overvoltage tests. Plan ahead to
know which overvoltage tests apply to the system.
System-level elements in the construction, such as fire
enclosure and spacing requirements, need to be
considered during the design stages. Consult with a
professional testing agency during the design of the
product to determine which tests apply to the system.
1.25 A
75 Ω @ 100 MHz, 6 A
1.25 A
75 Ω @ 100 MHz, 6 A
FB1
FB2
Si3018/19/10
C9
C8
C9
C8
RING
RING
TIP
TIP
83
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