TLP3062(S,C,F,T) Toshiba, TLP3062(S,C,F,T) Datasheet - Page 62

• Manufacturer Part Number: TLP3062(S,C,F,T)
• Description: PHOTOCOUPLER ZC TRIAC OUT 6-DIP
• Manufacturer: Toshiba

Specifications of TLP3062(S,C,F,T)

• Voltage - Isolation: 5000Vrms
• Number Of Channels: 1
• Voltage - Off State: 600V
• Output Type: AC, Triac, Zero Cross
• Current - Gate Trigger (igt) (max): 10mA
• Current - Hold (ih): 600µA
• Current - Dc Forward (if): 20mA
• Current - Output / Channel: 100mA
• Mounting Type: Through Hole
• Package / Case: 6-DIP
• Output Device: PhotoTriac
• Isolation Voltage: 5000 V
• Peak Output Voltage (vdrm): 600 V
• Maximum Input Voltage: 240 VAC
• Maximum Output Voltage: 600 V
• Minimum Trigger Current: 5 mA
• Configuration: 1 Channel
• Maximum Continuous Output Current: 100 mA
• Maximum Input Current: 25 mA
• Maximum Operating Temperature: + 100 C
• Maximum Power Dissipation: 330 mW
• Maximum Reverse Diode Voltage: 5 V
• Minimum Operating Temperature: - 40 C
• Mounting Style: Through Hole
• Zero-crossing Circuit: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: TLP3062(S,F); TLP3062SCFT; TLP3062SF; TLP3062SF

9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are
shown as reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
3
3
10000000
1000000
GaA As (DH) LED Projected Light Output Degradation Data
GaA As (DH) LED Projected Operating Life Data
140
120
100
140
120
100
Device Degradation
100000
80
60
40
20
80
60
40
20
10000
0
0
1000
1
1
100
227
2.0
I
I
I
I
I
Failure criteria light output degradation Δ P O < –50%
F
F
F
F
F
150
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
Test conditions: I
Test conditions: I
100
85
3.0
60
100
100
Test time (h)
Test time (h)
F
F
25
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
1000
1000
0
4.0
I
F
Ambient Temperature (°C)
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F50%
operating life
10000
10000
Projected F0.1%
operating life
X-3σ
–50
X-3σ
1 / K(×10
X
X
100000
100000
–73
5.0
−3
)
62
10000000
1000000
140
120
100
100000
80
60
40
20
10000
0
1000
100
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
Test conditions: I
100
85
3.0
60
100
Test time (h)
F
25
= 20 mA, Ta = 40°C
1000
0
4.0
Ambient Temperature (°C)
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Projected F0.1%
operating life
Projected F50%
operating life
10000
X-3σ
–50
X
1 / K(×10
100000
–73
5.0
−3
)