TLP2200(TP1) Toshiba, TLP2200(TP1) Datasheet

PHOTOCOUPLER LOGOUT 8-SOP

TLP2200(TP1)

Manufacturer Part Number
TLP2200(TP1)
Description
PHOTOCOUPLER LOGOUT 8-SOP
Manufacturer
Toshiba
Datasheets

Specifications of TLP2200(TP1)

Voltage - Isolation
2500Vrms
Number Of Channels
1, Unidirectional
Current - Output / Channel
25mA
Data Rate
2.5MBd
Propagation Delay High - Low @ If
250ns @ 1.6mA ~ 5mA
Current - Dc Forward (if)
10mA
Input Type
DC
Output Type
Tri-State
Mounting Type
Surface Mount
Package / Case
8-SMD (300 mil)
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
TLP2200TR
Isolated Buss Driver
High Speed Line Receiver
Microprocessor System Interfaces
MOS FET Gate Driver
Direct Replacement For HCPL−2200
The TOSHIBA TLP2200 consists of a GaAℓAs light
emitting diode and integrated high gain, high speed
photodetector.
This unit is 8−lead DIP package.
The detector has a three state output stage that
eliminates the need for pull−up resistor, and built−in
schmitt trigger. The detector IC has an internal shield
that provides a guaranteed common mode transient
immunity of 1000V / μs.
Truth Table
Input current: I
Power supply voltage: V
Switching speed: 2.5MBd guaranteed
Common mode transient immunity: ±1000V / μs (min.)
Guaranteed performance over temp: 0~85°C
Isolation voltage: 2500Vrms(min.)
UL recognized: UL1577, file No. E67349
Input
H
H
L
L
(positive logic)
F
= 1.6mA
Enable
H
H
L
L
CC
TOSHIBA Photocoupler GaAℓAs Ired & Photo-IC
= 4.5~20V
Output
H
Z
Z
L
TLP2200
1
Pin Configuration (top view)
Schematic
V
F
1
2
3
4
3
2
I
F
SHIELD
SHIELD
GND
V
Weight: 0.54 g (typ.)
TOSHIBA
CC
8
7
6
5
1: N.C.
2: Anode
3: Cathode
4: N.C.
5: GND
6: V
7: V
8: V
E
O
CC
(enable)
(output)
11−10C4
2007-10-01
I
TLP2200
CC
I
I
O
E
Unit in mm
8
7
6
5
V
V
V
GND
CC
O
E

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TLP2200(TP1) Summary of contents

Page 1

... High Speed Line Receiver Microprocessor System Interfaces MOS FET Gate Driver Direct Replacement For HCPL−2200 The TOSHIBA TLP2200 consists of a GaAℓAs light emitting diode and integrated high gain, high speed photodetector. This unit is 8−lead DIP package. The detector has a three state output stage that eliminates the need for pull− ...

Page 2

... Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). ...

Page 3

Electrical Characteristics Characteristic Output leakage current (V > Logic low output voltage Logic high output voltage Logic low enable current Logic high enable current Logic low enable voltage Logic high enable voltage Logic low supply current ...

Page 4

Switching Characteristics (unless otherwise specified 0~85°C,V Characteristic Propagation delay time to logic high output level (Note 5) Propagation delay time to logic low output level (Note 5) Output rise time (10−90%) Output fall time (90−10%) Output enable time ...

Page 5

Test Circuit pHL , Input 90% Output 2.15kΩ (ON) 1.6mA F Test Circuit pHZ pZH , Input V E Output V ...

Page 6

Test Circuit 3 Common Mode Transient Immunity 90 10 Switch 1.6mA F Output (MAX.) (*) Switch 0mA F (*) See ...

Page 7

... Product shall not be used for or incorporated into any products or systems whose manufacture, use, or sale is prohibited under any applicable laws or regulations. • The information contained herein is presented only as guidance for Product use. No responsibility is assumed by TOSHIBA for any infringement of patents or any other intellectual property rights of third parties that may result from the use of Product. No license to any intellectual property right is granted by this document, whether express or implied, by estoppel or otherwise. • ...

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