MAX11080GUU+ Maxim Integrated Products, MAX11080GUU+ Datasheet - Page 4

• Manufacturer Part Number: MAX11080GUU+
• Description: IC LI/BATTERY MANAGEMENT 38TSSOP
• Manufacturer: Maxim Integrated Products

Specifications of MAX11080GUU+

• Function: Battery Monitor
• Battery Type: Lithium-Ion (Li-Ion)
• Voltage - Supply: 6 V ~ 72 V
• Operating Temperature: -40°C ~ 105°C
• Mounting Type: Surface Mount
• Package / Case: 38-TSSOP (0.173", 4.40mm Width)
• Product: Charge Management
• Operating Supply Voltage: 6 V to 72 V
• Supply Current: 0.05 uA
• Maximum Operating Temperature: + 105 C
• Minimum Operating Temperature: - 40 C
• Charge Safety Timers: No
• Mounting Style: SMD/SMT
• Temperature Monitoring: No
• Uvlo Start Threshold: 1.6 V
• Uvlo Stop Threshold: 2.8 V
• No. Of Batteries: 12
• Supply Voltage Range: 6V To 72V
• Battery Ic Case Style: TSSOP
• No. Of Pins: 38
• Operating Temperature Range: -40°C To +105°C
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

V. Quality Assurance Information
VI. Reliability Evaluation
A. Quality Assurance Contacts:
B. Outgoing Inspection Level:
C. Observed Outgoing Defect Rate:
D. Sampling Plan:
A. Accelerated Life Test
follows:
1000 hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maxim-
ic.com/.
B. Moisture Resistance Tests
C. E.S.D. and Latch-Up Testing
except for one pin CP-. Pin CP- passed the negative current injection stress to -25mA. In system applications, pin CP- must
only be connected to companion pin CP+ and nothing else through a 0.01uF external capacitor. Such a configuration is
recognized by JEDEC JESD78 Annex A as a very unlikely source for latch-up on CP- (and CP+).
=
MTTF
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( ) is calculated as
The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly
The industry standard 85°C/85%RH or HAST testing is monitored per device process once a quarter.
The CO15 die type has been found to have all pins able to withstand a transient pulse of
Latch-Up testing has shown that this device withstands a current of +/- 100mA and overvoltage per JEDEC JESD78,
Current monitor data for the S45 Process results in a FIT Rate of 0.49 @ 25C and 8.49 @ 55C (0.8 eV, 60% UCL).
1
= 22.4 x 10
= 22.4 F.I.T. (60% confidence level @ 25°C)
ESD-HBM:
ESD-MM:
=
-9
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
192 x 4340 x 48 x 2
1.83
+/- 2500V per JEDEC JESD22-A114
+/- 200V per JEDEC JESD22-A115
(Chi square value for MTTF upper limit)
Richard Aburano (Manager, Reliability Operations)
Bryan Preeshl (Managing Director of QA)
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
< 50 ppm
Mil-Std-105D
MAX11080