AT24C08AN-10SI-1.8 Atmel, AT24C08AN-10SI-1.8 Datasheet - Page 2

• Manufacturer Part Number: AT24C08AN-10SI-1.8
• Description: IC EEPROM 8KBIT 400KHZ 8SOIC
• Manufacturer: Atmel

Specifications of AT24C08AN-10SI-1.8

• Format - Memory: EEPROMs - Serial
• Memory Type: EEPROM
• Memory Size: 8K (1K x 8)
• Speed: 100kHz, 400kHz
• Interface: I²C, 2-Wire Serial
• Voltage - Supply: 1.8 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 8-SOIC (3.9mm Width)
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Other names: AT24C08AN-10SI1.8; AT24C08AN10SI1.8

Absolute Maximum Ratings*
Pin Description
2
Operating Temperature........................................−40°C to +85°C
Storage Temperature .........................................−65°C to +150°C
Voltage on Any Pin
with Respect to Ground ........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT24C02A/04A
Figure 1. Block Diagram
SERIAL CLOCK (SCL): The SCL input is used to positive edge clock data into each
EEPROM device and negative edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for serial data transfer. This pin is
open-drain driven and may be wire-ORed with any number of other open-drain or open
collector devices.
DEVICE/PAGE ADDRESSES (A2, A1, A0): The A2, A1 and A0 pins are device
address inputs that must be hardwired for the AT24C02A. As many as eight 2K devices
may be addressed on a single bus system. (Device addressing is discussed in detail
under Device Addressing, page 8).
START
LOGIC
STOP
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
0976Q–SEEPR–8/05