M27C4001-12F1 STMicroelectronics, M27C4001-12F1 Datasheet - Page 4

IC EPROM 4MBIT 120NS 32CDIP

M27C4001-12F1

Manufacturer Part Number
M27C4001-12F1
Description
IC EPROM 4MBIT 120NS 32CDIP
Manufacturer
STMicroelectronics
Datasheets

Specifications of M27C4001-12F1

Format - Memory
EPROMs
Memory Type
UV EPROM
Memory Size
4M (512K x 8)
Speed
120ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
0°C ~ 70°C
Package / Case
32-CDIP (0.600", 15.24mm) Window
Capacitance, Input
6 pF
Capacitance, Output
12 pF
Current, Input, Leakage
±10 μA (Read)
Current, Operating
30 mA (Read)
Current, Output, Leakage
±10 μA (Read)
Current, Supply
30 mA
Density
4M
Organization
512K×8
Package Type
FDIP32W
Temperature, Operating
0 to +70 °C
Temperature, Operating, Maximum
70 °C
Temperature, Operating, Minimum
0 °C
Time, Access
100 ns
Time, Fall
≤20 ns
Time, Programmable
100 μs
Time, Rise
≤20 ns
Voltage, Input, High
6 V (Read)
Voltage, Input, High Level
2 V (Min.)
Voltage, Input, Low
0.8 V (Read)
Voltage, Input, Low Level
-0.3 V (Max.)
Voltage, Output, High
4.3 V (Read)
Voltage, Output, Low
0.4 V (Read)
Voltage, Programmable
11.5 V (Min.)
Voltage, Supply
5 V
Memory Configuration
512K X 8
Access Time
120ns
Supply Voltage Range
4.5V To 5V
Memory Case Style
FDIPW
No. Of Pins
32
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-1661-5

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M27C4001
4
DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC Characteristic tables that
follow are derived from tests performed under the Measurement Conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Table 5.
Figure 6.
Figure 7.
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
AC Measurement Conditions
AC Testing Input Output Waveform
AC Testing Load Circuit
High Speed
Standard
C L = 30pF for High Speed
C L = 100pF for Standard
C L includes JIG capacitance
2.4V
0.4V
DEVICE
UNDER
3V
0V
TEST
1.3V
High Speed
1N914
3.3k
C L
0 to 3V
1.5V
10ns
OUT
AI01823B
1.5V
2.0V
0.8V
AI01822
DC and AC parameters
0.4 to 2.4V
0.8 and 2V
Standard
20ns
13/25

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