MAX9217ECM Maxim Integrated, MAX9217ECM Datasheet - Page 14

• Manufacturer Part Number: MAX9217ECM
• Description: Serializers & Deserializers - Serdes 27-Bit DC-Balanced Serializer
• Manufacturer: Maxim Integrated
• Type: Serializerr

Specifications of MAX9217ECM

• Data Rate: 700 Mbit/s
• Input Type: LVCMOS/LVTTL
• Output Type: LVDS
• Number Of Inputs: 27
• Number Of Outputs: 1
• Operating Supply Voltage: 3 V to 3.6 V
• Operating Temperature Range: - 40 C to + 85 C
• Package / Case: TQFP-48
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT

27-Bit, 3MHz-to-35MHz
DC-Balanced LVDS Serializer
Separate the LVTTL/LVCMOS inputs and LVDS output to
prevent crosstalk. A four-layer PCB with separate layers
for power, ground, and signals is recommended.
The MAX9217 ESD tolerance is rated for Human Body
Model, Machine Model, and ISO 10605. ISO 10605
Figure 14. Human Body ESD Test Circuit
Figure 15. ISO 10605 Contact-Discharge ESD Test Circuit
PROCESS: CMOS
14
______________________________________________________________________________________
VOLTAGE
SOURCE
VOLTAGE
SOURCE
HIGH-
HIGH-
DC
DC
CHARGE-CURRENT-
CHARGE-CURRENT-
LIMIT RESISTOR
LIMIT RESISTOR
50Ω TO 100Ω
1MΩ
100pF
330pF
C
C
S
S
RESISTANCE
DISCHARGE
RESISTANCE
DISCHARGE
STORAGE
CAPACITOR
STORAGE
CAPACITOR
Chip Information
1.5kΩ
2kΩ
R
R
D
D
ESD Protection
Board Layout
DEVICE
UNDER
DEVICE
UNDER
TEST
TEST
specifies ESD tolerance for electronic systems. The
Human Body Model, Machine Model, discharge com-
ponents are C
The ISO 10605 discharge components are C
and R
charge components are C
(Figure 16).
For the latest package outline information and land patterns, go
to www.maxim-ic.com/packages.
Figure 16. Machine Model ESD Test Circuit
PACKAGE TYPE
48 LQFP
48 TQFN
VOLTAGE
SOURCE
D
HIGH-
DC
= 2kΩ (Figure 15). The Machine Model dis-
CHARGE-CURRENT-
LIMIT RESISTOR
S
= 100pF and R
PACKAGE CODE
200pF
Package Information
C
S
T4866+1
C48+5
RESISTANCE
DISCHARGE
STORAGE
CAPACITOR
S
0Ω
R
= 200pF and R
D
D
= 1.5kΩ (Figure 14).
DOCUMENT NO.
21-0054
21-0141
S
DEVICE
UNDER
TEST
= 330pF
D
= 0Ω