MAX4031EEUD-T Maxim Integrated, MAX4031EEUD-T Datasheet - Page 8

• Manufacturer Part Number: MAX4031EEUD-T
• Description: High Speed Operational Amplifiers
• Manufacturer: Maxim Integrated

Specifications of MAX4031EEUD-T

• Number Of Channels: 3
• Voltage Gain Db: 80 dB
• Input Offset Voltage: 13 mV at 5 V
• Slew Rate: 115 V/us at 5 V
• Operating Supply Voltage: 5 V
• Maximum Operating Temperature: + 85 C
• Package / Case: TSSOP-14
• Common Mode Rejection Ratio (min): 50 dB
• Gain Bandwidth Product: 144 MHz
• Maximum Power Dissipation: 727 mW
• Minimum Operating Temperature: - 40 C
• Supply Voltage - Max: 5.5 V
• Supply Voltage - Min: 4.5 V

Figure 8 shows the Human Body Model and Figure 9
shows the current waveform it generates when dis-
charged into low impedance. This model consists of a
150pF capacitor charged to the ESD voltage of interest,
and then discharged into the test device through a
1.5k resistor.
Low-Cost, 144MHz, Dual/Triple Op Amps
with ±15kV ESD Protection
Figure 4. Isolation Resistance vs. Capacitive Load
Figure 5. Small-Signal Gain vs. Frequency with Load
Capacitance and No Isolation Resistor
8
_______________________________________________________________________________________
SMALL-SIGNAL GAIN vs. FREQUENCY WITH LOAD
20
18
16
14
12
10
-1
-2
-3
-4
-5
-6
8
6
4
2
0
CAPACITANCE AND NO ISOLATION RESISTOR
6
5
4
3
2
1
0
0.1
0
100
ISOLATION RESISTANCE
vs. CAPACITIVE LOAD
1
CAPACITIVE LOAD (pF)
FREQUENCY (MHz)
200
C
C
L
L
= 20pF
= 10pF
10
C
300
L
= 5pF
Human Body Model
100
400
1000
500
The IEC 1000-4-2 standard covers ESD testing and per-
formance of finished equipment; it does not specifically
refer to ICs. The MAX4030E/MAX4031E enable the
design of equipment that meets the highest level (level
4) of IEC 1000-4-2 without the need for additional ESD
protection components. The major difference between
tests done using the Human Body Model and IEC 1000-
4-2 is higher peak current in IEC 1000-4-2. Because
series resistance is lower in the IEC 1000-4-2 model, the
ESD-withstand voltage measured to this standard is gen-
erally lower than that measured using the Human Body.
Figure 10 shows the IEC 1000-4-2 model and Figure 11
shows the current waveform for the ±8kV IEC 1000-4-2
level 4 ESD Contact Discharge test. The Air-Gap test
involves approaching the device with a charged probe.
The Contact Discharge method connects the probe to
the device before the probe is energized.
MAX4030E TRANSISTOR COUNT: 271
MAX4031E TRANSISTOR COUNT: 387
PROCESS: BiCMOS
Figure 6. Small-Signal Gain vs. Frequency with Load
Capacitance and 10 Isolation Resistor
SMALL-SIGNAL GAIN vs. FREQUENCY WITH LOAD
CAPACITANCE AND 10 ISOLATION RESISTOR
-1
-2
-3
-4
-5
-6
6
5
4
3
2
1
0
0.1
1
FREQUENCY (MHz)
C
C
L
L
= 20pF
= 10pF
Chip Information
10
C
L
= 5pF
100
IEC 1000-4-2
1000