LC4512C-10FTN256I Lattice, LC4512C-10FTN256I Datasheet - Page 41

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LC4512C-10FTN256I

Manufacturer Part Number
LC4512C-10FTN256I
Description
CPLD - Complex Programmable Logic Devices ispJTAG 1.8V 10nsIND 512MC 208 I/O
Manufacturer
Lattice
Datasheet

Specifications of LC4512C-10FTN256I

Rohs
yes
Memory Type
EEPROM
Number Of Macrocells
512
Maximum Operating Frequency
125 MHz
Delay Time
10 ns
Number Of Programmable I/os
208
Operating Supply Voltage
1.8 V
Maximum Operating Temperature
+ 105 C
Minimum Operating Temperature
- 40 C
Package / Case
FTBGA
Mounting Style
SMD/SMT
Number Of Product Terms Per Macro
80
Factory Pack Quantity
450
Supply Current
4 mA
Supply Voltage - Max
1.95 V
Supply Voltage - Min
1.65 V

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
LC4512C-10FTN256I
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
Lattice Semiconductor
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 11.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Table 11. Test Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
1. C
L
includes test fixtures and probe capacitance.
Test Condition
DUT
106 106
106
106
R
1
106
106
R
2
V
R 1
R 2
41
CCO
35pF
35pF
35pF
5pF
5pF
C
L
ispMACH 4000V/B/C/Z Family Data Sheet
1
C L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
1.5V
1.5V
V
V
OH
OL
+ 0.3
- 0.3
0213A/ispm4k
Timing Ref.
Point
Test
CCO
CCO
/2
/2
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = 1.65V
3.0V
3.0V
3.0V
3.0V
V
CCO

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