AD7870LP-REEL Analog Devices, AD7870LP-REEL Datasheet - Page 14

• Manufacturer Part Number: AD7870LP-REEL
• Manufacturer: Analog Devices

DSCC FORM 2234
APR 97
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for
groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
4.4.1 Group A inspection.
a.
b.
c.
a.
b.
c.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
For device class M, Q and V subgroups 7 and 8 tests shall be sufficient to verify the truth table.
Parameters specified in table I herein with note 5/ shall be tested on initial release or design.
Sample size shall be 15, 0 failures allowed.
A
= +125 C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43216-5000
1/ PDA applies to subgroup 1.
Interim electrical
Final electrical
Group A test
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
parameters (see 4.2)
parameters (see 4.2)
requirements (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
Test requirements
STANDARD
TABLE II. Electrical test requirements.
1
1,2,3,4,5,6, 1/
7,8,9,10,11
1,2,3,4,5,6,
7,8,9,10,11
1
1
method 5005, table I)
(in accordance with
MIL-STD-883,
Subgroups
class M
Device
---
SIZE
A
1
1,2,3,4,5, 1/
6,7,8,9,10,11
1,2,3,4,5,6,
7,8,9,10,11
1
1
MIL-PRF-38535, table III)
class Q
Device
(in accordance with
---
REVISION LEVEL
Subgroups
1
1,2,3,4,5, 1/
6,7,8,9,10,11
1,2,3,4,5,6,
7,8,9,10,11
1,2,3,4,5,6,
9,10,11
1
A
class V
Device
---
SHEET
5962-90632
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