EP220 ALTERA [Altera Corporation], EP220 Datasheet - Page 9

• Manufacturer Part Number: EP220
• Description: Classic EPLDs
• Manufacturer: ALTERA [Altera Corporation]

Altera Corporation
Software &
Programming
Support
f
Figure 3. EP220 & EP224 AC Test Circuits
Test programs are used and then erased during the early stages of the
device production flow. EPROM-based devices in one-time-
programmable, windowless packages also contain on-board logic test
circuitry to allow verification of function and AC specifications during the
production flow.
The EP220 is supported by the Altera MAX+PLUS II development
software, Altera programming hardware, and third-party hardware. Both
the EP220 and EP224 are supported by the Altera PLDshell Plus design
software, third-party logic compilers (e.g., ABEL, CUPL, PLDesigner,
LOG/IC, and iPLS II), and third-party programming hardware (e.g., Data
I/O).
For more information on software support with PLDshell Plus, go to the
PLDshell Plus/PLDasm User’s Guide (available from the Altera
Literature Department). For more information on MAX+PLUS II, go to
the
Sheet
the
Manufacturers Data Sheet
Altera and third-party programming hardware support.
Power-supply transients can affect AC
measurements. Simultaneous transitions of
multiple outputs should be avoided for
accurate measurement. Threshold tests
must not be performed under AC
conditions. Large-amplitude, fast ground-
current transients normally occur as the
device outputs discharge the load
capacitances. When these transients flow
through the parasitic inductance between
the device ground pin and the test-system
ground, significant reductions in observable
noise immunity can result. Numbers in
parentheses are for the EP224 device.
MAX+PLUS II Programmable Logic Development System & Software Data
Programming Hardware Data Sheet
in the Altera 1995 Data Book , or refer to MAX+PLUS II Help. Go to
in the Altera 1995 Data Book for information on
and the
Device
Output
EP220 & EP224 Classic EPLDs
165
(330 )
120
(200 )
Programming Hardware
C1 (includes
JIG capacitance)
VCC
to Test
System
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