CL21C220 SAMSUNG [Samsung semiconductor], CL21C220 Datasheet - Page 23

• Manufacturer Part Number: CL21C220
• Description: Multilayer Ceramic Capacitor
• Manufacturer: SAMSUNG [Samsung semiconductor]

NO
10
7
8
9
Multilayer Ceramic Capacitor
TEMPERATURE
CHARACTERISTIC
S
TEMPERATURE
CAPACITANCE
COEFFICIENT
STRENGTH
BENDING
ADHESIVE STRENGTH
OF TERMINATION
ITEM
APPEARANCE
CAPACITANCE
CLASS
CLASS
Ⅰ
Ⅱ
CAPACITANCE CHANGE
NO INDICATION OF PEELING SHALL
OCCUR ON THE TERMINAL
ELECTRODE.
NO MECHANICAL DAMAGE SHALL
OCCUR.
CLASS II
CHARACTERISTIC
CHAR.
A,B
CHARACTER
F
C0G
PH
RH
SH
CLASS I
TH
UL
SL
PERFORMANCE
A,B
CAP. CHANGE(%)
F
+22% ~ -82%
TEMP. COEFFICIENT
± 15%
+350 ~ -1000
CHANGE OF
CAPACITANCE
WITHIN ± 5%
OR ± 0.5 pF
WHICHEVER IS
LARGER
WITHIN ± 12.5%
WITHIN ± 30%
-750 ± 120
-150 ± 60
-220 ± 60
-330 ± 60
-470 ± 60
(PPM/℃)
0 ± 30
THESE SYMMETRICAL TOLERANCE APPLY TO
2 POINT MEASUREMENT OF TEMPERATURE
COEFFICIENT: ONE AT 25 ℃ AND AT 85 ℃
The change of capacitance should be got from
the capacitance at 25 ℃ .
After capacitance measured from Min. Temp. to
Max. Temp.,
it should be calculated from the formula below.
C1 : CAPACITANCE AT STANDARD
C2 : CAPACITANCE AT EACH
A 500g.f PRESSURE SHALL BE
APPLIED FOR 10 ± 1 SECOND.
SEE (FIG.1)
BENDING SHALL BE APPLIED TO
THE LIMIT(1mm) WITH 0.3mm/SEC.
KEEP THE TEST BOARD AT THE LIMIT POINT
IN 5 SEC., THEN MEASURE CAPACITANCE.
SEE (FIG.2)
○
C2 - C1
CHARACTER
STEP
C, A, B, F
C1
TEMPERATURE
45 ± 1
1
2
3
4
5
TEMPERATURE(25 ℃ )
50
× 100 %
20
TEST CONDITION
45 ± 1
MAX RATED TEMP ± 2
MIN RATED TEMP ± 2
R=340
TEMPERATURE
LIMIT
○
1mm
BENDING
LIMIT
25 ± 2
25 ± 2
25 ± 2
500g.f
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