AXX2520 AXTAL [Advanced XTAL Products], AXX2520 Datasheet - Page 2
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AXX2520
Manufacturer Part Number
AXX2520
Description
Quartz Crystal Unit in SMD package 2.5x2.0 mm RoHS compliant
Manufacturer
AXTAL [Advanced XTAL Products]
Datasheet
1.AXX2520.pdf
(2 pages)
Enclosure drawing
Environmental conditions
Test
Visual inspection,
dimensions
Sealing tests
Solderability
Resistance to
soldering heat
Shock
Bump
Free fall
Vibration, sinusoidal
Rapid change of
temperature
Dry heat
Damp heat, cyclic
Cold
Climatic sequence
Damp heat, steady
state
Endurance tests
- ageing
- extended aging
Wasemweg 5
D-74821 Mosbach
Germany
GmbH & Co. KG
IEC 60068
Part ...
2-17
2-20
2-27
2-29
2-32
2-6
2-14
2-2
2-30
2-1
1-7
2-3
IEC 61178-1
clause ...
4.5
4.6
4.8.2
4.8.3
4.8.8
4.8.6
4.8.9
4.8.7
4.8.5
4.8.11
4.8.12
4.8.13
4.8.14
4.8.15
4.9.1
4.9.2
Test conditions
Enclosure styles as in IEC
60122-3, if applicable
Gross leak: Test Qc,
Fine leak: Test Qk
Test Ta (235 ± 5)°C Method 1
Test Tb Method 1A, 5s
Test Ea, 3 x per axes 100g, 6 ms
half-sine pulse
Test Eb, 4000 bumps per Axes,
40g, 6 ms
Test Ed procedure 1,
2 drops from 1m height
Test Fc, 30 min per axes,
10 Hz - 55 Hz 0,75mm; 55 Hz -
1 kHz, 10g
Test Na, 10 cycles at extremes of
operating temperature range
Test Ba, 16 h at upper
temperature indicated by
climatic category
Test Db variant 1 severity b),
55°C/95% r.H., 6 cycles
Test Aa, 2 h at lower
temperature indicated by
climatic category
Sequence of 4.8.11, 4.8.12 (1
cycle), 4.8.13, 4.8.12 (5 cycles)
Test Ca, 56 days
30 days @ 85°C
1000h, 2000h, 8000h @85°C
page
AXX2520
2(2)
st
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