AM27C256-120DCB AMD [Advanced Micro Devices], AM27C256-120DCB Datasheet - Page 9
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AM27C256-120DCB
Manufacturer Part Number
AM27C256-120DCB
Description
256 Kilobit (32 K x 8-Bit) CMOS EPRO
Manufacturer
AMD [Advanced Micro Devices]
Datasheet
1.AM27C256-120DCB.pdf
(12 pages)
TEST CONDITIONS
SWITCHING TEST WAVEFORM
KEY TO SWITCHING WAVEFORMS
Note:
Diodes are IN3064 or equivalents.
Note: For C
3 V
0 V
Device
Under
Test
WAVEFORM
1.5 V
L
= 30 pF.
Input
Figure 3. Test Setup
C L
Test Points
Don’t Care, Any Change Permitted
6.2 k
Does Not Apply
5.0 V
INPUTS
Output
2.7 k
08007I-7
1.5 V
Am27C256
Note: For C
2.4 V
0.45 V
Changing from H to L
Changing from L to H
Output Load
Output Load Capacitance, C
(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement
reference levels
Output timing measurement
reference levels
Steady
Test Condition
Center Line is High Impedance State (High Z)
L
Table 1. Test Specifications
= 100 pF.
Input
Changing, State Unknown
2.0 V
0.8 V
OUTPUTS
Test Points
L
-45, -55
and -70
0.0–3.0
1.5
1.5
30
2.0 V
0.8 V
1 TTL gate
20
0.45–2.4
0.8, 2.0
0.8, 2.0
others
KS000010-PAL
100
Output
All
08007I-8
Unit
pF
ns
V
V
V
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