HA4-5320883 INTERSIL [Intersil Corporation], HA4-5320883 Datasheet
HA4-5320883
Related parts for HA4-5320883
HA4-5320883 Summary of contents
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... This monolithic device is manufactured using the Intersil Dielectric Isolation Process, minimizing stray capacitance and eliminating SCR’s. This allows higher speed and latch-free operation. For further information, please see Application Note AN538. Ordering Information PART NUMBER HA1-5320/883 HA4-5320/883 EXT Functional Diagram -INPUT 1 2 +INPUT NC ...
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Absolute Maximum Ratings Voltage Between V+ and V- Terminals . . . . . . . . . . . . . . . . . . . . 40V Differential Input Voltage . . . . . . . ...
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TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS Device Tested at +15V -15V; V Unless Otherwise Specified PARAMETERS SYMBOL Output Voltage Swing + Power Supply Current + Power Supply Rejection +PSRR Ratio ...
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TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS PARAMETER SYMBOL Hold Mode Feedthrough V V HMF Hold Step Error V V ERROR T Sample Mode Noise 10MHz, V N(SAMPLE) Voltage R Hold Mode Noise 10MHz, V N(HOLD) ...
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Die Characteristics DIE DIMENSIONS 152 x 19 1mils METALLIZATION: Type: Al Å Å Thickness: 16k 2k GLASSIVATION: Type: Nitride ( over Silox (SiO 3 4 Å Å Silox Thickness: 12k 2k Å Å Nitride ...
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Burn-In Circuits - NOTES 100k , 5%, (per socket 0.01 F minimum per socket or 0.1 F minimum per row ...
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Packaging -D- -A- E -B- bbb BASE Q PLANE A -C- SEATING PLANE aaa ccc NOTES: 1. ...
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Packaging (Continued HA-5320/883 J20.A MIL-STD-1835 CQCC1-N20 (C-2) 20 PAD METAL SEAL LEADLESS CERAMIC CHIP CARRIER SYMBOL A 0.060 A1 ...
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Semiconductor DESIGN INFORMATION August 1999 The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Applying the HA-5320 The HA-5320 has ...
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DESIGN INFORMATION The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Test Circuits S/H CONTROL INPUT CHARGE TRANSFER TEST 1. ...
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DESIGN INFORMATION The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Performance Curves V SUPPLY TYPICAL SAMPLE AND HOLD PERFORMANCE ...
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DESIGN INFORMATION The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica- tion and design information only. No guarantee is implied. Glossary of Terms Acquisition Time The time required following ...