AM79C960KCW Advanced Micro Devices, AM79C960KCW Datasheet - Page 28
AM79C960KCW
Manufacturer Part Number
AM79C960KCW
Description
PCnetTM-ISA Single-Chip Ethernet Controller
Manufacturer
Advanced Micro Devices
Datasheet
1.AM79C960KCW.pdf
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PIN DESCRIPTION:
NETWORK INTERFACES
AUI Interface
CI+, CI–
Control Input
This is a differential input pair used to detect Collision
(Signal Quality Error Signal).
DI+, DI–
Data In
This is a differential receive data input pair to the PCnet-
ISA controller.
DO+, DO–
Data Out
This is a differential transmit data output pair from the
PCnet-ISA controller.
Twisted Pair Interface
RXD+, RXD–
Receive Data
This is the 10BASE-T port differential receive input pair.
TXD+, TXD–
Transmit Data
These are the 10BASE-T port differential transmit
drivers.
AMD
Input
Input
Output
Input
Output
P R E L I M I N A R Y
Am79C960
TXP+, TXP–
Transmit Predistortion Control Output
These are 10BASE-T transmit waveform pre-distortion
control differential outputs.
PIN DESCRIPTION
IEEE 1149.1 (JTAG) TEST ACCESS PORT
TCK
Test Clock
This is the clock input for the boundary scan test mode
operation. TCK can operate up to 10 MHz. If left uncon-
nected, this pin has a default value of HIGH.
TDI
Test Data Input
This is the test data input path to the PCnet-ISA control-
ler. If left unconnected, this pin has a default value of
HIGH.
TDO
Test Data Output
This is the test data output path from the PCnet-ISA con-
troller. TDO is tri-stated when JTAG port is inactive.
TMS
Test Mode Select
This is a serial input bit stream used to define the spe-
cific boundary scan test to be executed.
unconnected, this pin has a default value of HIGH.
Input
Input
Output
Input
If left
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