AM29F100-1 Advanced Micro Devices, AM29F100-1 Datasheet

no-image

AM29F100-1

Manufacturer Part Number
AM29F100-1
Description
1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only/ Boot Sector Flash Memory-Die Revision 1
Manufacturer
Advanced Micro Devices
Datasheet
Am29F100 Known Good Die
1 Megabit (128 K x 8-Bit/64 K x 16-Bit)
CMOS 5.0 Volt-only, Boot Sector Flash Memory—Die Revision 1
DISTINCTIVE CHARACTERISTICS
Single power supply operation
— 5.0 V
— Simplifies system-level power requirements
High performance
— 120 ns maximum access time
Low power consumption
— 20 mA typical active read current for byte mode
— 28 mA typical active read current for word mode
— 30 mA typical program/erase current
— 25 A typical standby current
Flexible sector architecture
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and
— One 8 Kword, two 4 Kword, one 16 Kword, and
— Any combination of sectors can be erased
— Supports full chip erase
Top or bottom boot block configurations
available
Sector protection
— Hardware-based feature that disables/re-
— Sector protection/unprotection can be
— Temporary Sector Unprotect feature allows in-
operations
one 64 Kbyte sectors (byte mode)
one 32 Kword sectors (word mode)
enables program and erase operations in any
combination of sectors
implemented using standard PROM
programming equipment
system code changes in protected sectors
SUPPLEMENT
10% for read, erase, and program
Embedded Algorithms
— Embedded Erase algorithm automatically
— Embedded Program algorithm automatically
Minimum 100,000 program/erase cycles
guaranteed
Compatible with JEDEC standards
— Pinout and software compatible with
— Superior inadvertent write protection
Data Polling and Toggle Bits
— Provides a software method of detecting
Ready/Busy pin (RY/BY#)
— Provides a hardware method for detecting
Erase Suspend/Erase Resume
— Suspends an erase operation to read data from,
Hardware RESET# pin
— Hardware method of resetting the device to
Tested to datasheet specifications at
temperature
Quality and reliability levels equivalent to
standard packaged components
pre-programs and erases the chip or any
combination of designated sector
programs and verifies data at specified address
single-power-supply flash
program or erase cycle completion
program or erase cycle completion
or program data to, a sector that is not being
erased, then resumes the erase operation
reading array data
Publication# 21235
Issue Date: January 1998
Rev: B Amendment/0

Related parts for AM29F100-1

AM29F100-1 Summary of contents

Page 1

... SUPPLEMENT Am29F100 Known Good Die 1 Megabit (128 K x 8-Bit/ 16-Bit) CMOS 5.0 Volt-only, Boot Sector Flash Memory—Die Revision 1 DISTINCTIVE CHARACTERISTICS Single power supply operation — 5.0 V 10% for read, erase, and program operations — Simplifies system-level power requirements High performance — 120 ns maximum access time Low power consumption — ...

Page 2

... GENERAL DESCRIPTION The Am29F100 in Known Good Die (KGD) form Mbit, 5.0 Volt-only Flash memory. AMD defines KGD as standard product in die form, tested for functionality and speed. AMD KGD products have the same reli- ability and quality as AMD products in packaged form. Am29F100 Features The Am29F100 Mbit, 5 ...

Page 3

... AMD logo location Am29F100 Known Good Die Am29F100 KGD -120 120 120 50 Orientation relative to leading edge of tape and reel ...

Page 4

... Am29F100 Known Good Die Pad Center (millimeters 0.00 0.00 –0.42 0.02 –0.69 0.02 –0.96 0.02 –1.23 0.02 –1.50 0.02 –1.77 0.02 –2.04 0.02 –2.31 0.02 –2.62 0.02 –2.78 0.02 –2.91 –0.52 –2.91 –0.75 –2.88 –0.94 –2.80 –3.10 –2.54 – ...

Page 5

... Valid Combinations list configurations planned to be sup- ported in volume for this device. Consult the local AMD sales office to confirm availability of specific valid combinations and to check on newly released combinations. Am29F100 Known Good Die ® Die Tray ® Wafer Tray (sawn wafer on frame) ...

Page 6

... PRODUCT TEST FLOW Figure 1 provides an overview of AMD’s Known Good Die test flow. For more detailed information, refer to the Am29F100 product qualification database supplement for KGD. AMD implements quality assurance proce- dures throughout the product test flow. In addition hours at 250 C ...

Page 7

... AMD recommends assembly in a Class 10K clean room with 30% to 60% relative humidity. Storage (max) = 130 C J Store at a maximum temperature nitrogen- purged cabinet or vacuum-sealed bag. Observe all standard ESD handling procedures. Am29F100 Known Good Die (Bottom Boot .98242ABK 7 ...

Page 8

... AMD for any damages resulting in such use or sale. REVISION SUMMARY FOR AM29F100 KNOWN GOOD DIE Formatted to match current template. Updated Distinc- tive Characteristics and General Description sections using the current main data sheet. Changed Surftape quantity to 1600. Am29F100 Known Good Die ...

Related keywords