AM29F010-1 Advanced Micro Devices, AM29F010-1 Datasheet - Page 6

• Manufacturer Part Number: AM29F010-1
• Description: 1 Megabit (128 K x 8-Bit) CMOS 5.0 Volt-only/ Uniform Sector Flash Memory-Die Revision 1
• Manufacturer: Advanced Micro Devices

PRODUCT TEST FLOW
Figure 1 provides an overview of AMD’s Known Good
Die test flow. For more detailed information, refer to the
Am29F010 product qualification database supplement
for KGD. AMD implements quality assurance proce-
dures throughout the product test flow. In addition, an
6
Packaging for Shipment
High Temperature
24 hours at 250 C
Figure 1. AMD KGD Product Test Flow
Wafer Sort 1
Wafer Sort 3
Wafer Sort 2
Shipment
Am29F010 Known Good Die
Bake
S U P P L E M E N T
off-line quality monitoring program (QMP) further guar-
antees AMD quality standards are met on Known Good
Die products. These QA procedures also allow AMD to
produce KGD products without requiring or imple-
menting burn-in.
Incoming Inspection
Wafer Saw
Die Separation
100% Visual Inspection
Die Pack
Data Retention
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
Speed
DC Parameters
Functionality
Programmability
Erasability
1/13/98