LM9073T National Semiconductor, LM9073T Datasheet - Page 16

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LM9073T

Manufacturer Part Number
LM9073T
Description
Dual High Current Low-Dropout System Regulator
Manufacturer
National Semiconductor
Datasheet
www.national.com
Application Information
Electro-Magnetic Compatibiltiy (EMC)
Systems utilizing the LM9073 will not experience loss of sup-
ply or false reset signals from the regulator when subjected
to high frequency interference from a standard Bulk Current
Injection test (ISO11452 Part 4 test method). The following
test conditions and configuration (Figure 9) can be used to
verify this performance:
• Frequency Range
• Modulation 1
• Modulation 2
• Dwell Time
• Frequency Steps
BCI Susceptibility, Modulation 1 (CW)
20MHz (from 200MHz to 400MHz)
2MHz (from 10MHz to 200MHz)
1MHz (from 1MHz to 10MHz)
1kHz sine wave, 80% AM
(Continued)
1MHz to 400MHz
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(no modulation)
Figure 10. Examples of BCI Test
Figure 9. EMC Test Circuit
1 second
16
• Test Method
In this test configuration the current injected in to either the
input pin or the tracking output pin is increased until a reset
output is generated. These two pins are the most critical as
they typically will connect to a module through long lengths
of wire most likely to pick up high frequency energy. Figure
10 illustrates examples of test results on the LM9073 with
both types of modulation.
These results are just examples as actual results in any
given application will depend on numerous external factors
such as component selection, pc board layout, etc. The cur-
rent power of the injected signal is expressed indB relative to
1mA (i.e. 40dBmA = 100mA)
BCI Susceptibility, Modulation 2 (CW)
(1kHz, 80% AM Modulation)
Closed loop current probe
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