AT89C51ED2-SMSIM ATMEL Corporation, AT89C51ED2-SMSIM Datasheet - Page 8

• Manufacturer Part Number: AT89C51ED2-SMSIM
• Description: 8-bit Flash Microcontroller
• Manufacturer: ATMEL Corporation

4.2 Qualification Test Methods
General Requirements for Plastic packaged CMOS ICs:
8
JEDEC 20-STD
Method 3015.7
JESD22-A101
JESD22-A110
MIL-STD 883
MIL-STD 883
MIL-STD 883
MIL-STD 883
Method 1005
MIL-STD 883
Method 1005
MIL-STD 883
Method 1010
Method 2003
Method 2015
Method 005
Method 005
PAQA0184
AEC Q100
AEC Q100
JEDEC 78
Standard
Atmel
EIA
EIA
EIA
50mW power injection, 50% overvoltage @125°C
Electrical Life Test (Latent Failure Rate)
Electrical Life Test (Early Failure Rate)
Soldering Stress 220°C/235°c/3 times
1000 hours 140°C Dynamic or Static
+/-2000v 1.5kOhm/100pF/3 pulses
High Temperature Storage 165°C
1000 cycles –65°C/150°C air/air
Electrostatic Discharge HBM
HAST after Preconditioning
Program Erase Cycles 25°C
144 hours 130°C/85%RH
1000 hours 85°C/85%RH
336 hours 130°C/85%RH
Marking Permanency
Temperature Cycling
NVM Data Retention
85/85 Humidity Test
NVM Endurance
Preconditioning
Test Description
48 hours 140°C
Solderability
Latch up
HAST
AT89C51RD2 / AT89C51ED2 QualPack
0/11 per class
0/5 per stress
0/100 - 500h
0/3 per level
Acceptance
0/50 - 500h
0/50 - 10kc
0/300 - 48h
0/50 - 500h
0/50 - 500c
0/50 - 168h
0/50 – 96h
0/3
0/5
Rev. 0 – 2003 July