AT17LV010-10DP-MQ ATMEL [ATMEL Corporation], AT17LV010-10DP-MQ Datasheet - Page 6

• Manufacturer Part Number: AT17LV010-10DP-MQ
• Description: MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEGABIT SERIAL EEPROM, MONOLITHIC SILICON
• Manufacturer: ATMEL [ATMEL Corporation]

4
QUALITY ASSURANCE PROVISIONS
3.2.3
3.3
The measurements shall be performed at T
respectively.
3.4
3.4.1
specified in test method 1015 of MIL-STD-883.
3.4.2
this specification. Unless otherwise stated, measurements shall be performed at + 22 + 3 ° C. The
parameter drift values (Δ), applicable to the parameters scheduled, shall not be exceeded.
parameter in Table 1 shall not be exceeded.
.
3.5
3.5.1
3.5.2
measurements shall be performed at t amb = 22+3°C.
3.5.3
3.6
3.6.1
Continuous bias shall be applied during irradiation testing as shown in Figure 6 of this specification.
3.6.2
scheduled in Table 1 of this specification.
4.1
Circuit for use in performing the power burn-in is shown in figure 5, in accordance with the intent
For space application, the parameter drift values applicable to burn-in are specified in Table 2 of
In addition to these drift value requirements, the appropriate limit value specified for a given
The circuit for operating life testing shall be as specified for power burn in (figure 5).
The parameters to be measured are scheduled in Table 1. Unless otherwise stated, the
The conditions for operating life testing shall be as specified for power burn in.
The parameters to be measured prior to, during and on completion of irradiation texture are
Each component shall be marked in respect of traceability information : lot number and date code.
The parameters to be measured with respect of electrical characteristics are scheduled in Table 1.
Compliant with ATMEL Quality Management System.
Electrical characteristics
Burn-in test
Environmental and Endurance Tests
Total dose irradiation testing
Wafer lot acceptance test
Traceability Information
Electrical circuit
Parameters drift value
Electrical Circuit for Operating LifeTest
Electrical Measurements at Completion of Environmental and endurance tests
Conditions for Operating LifeTest
Bias Conditions
Electrical Measurements
amb
=22 ± 3°C, T
high
=125 (+0/-5)°C and T
low
= -55 (+5/-0)°C
PS-AT17LV010
Sheet 6 / 15
Rev A