AT24C32-10SC ATMEL [ATMEL Corporation], AT24C32-10SC Datasheet - Page 2

• Manufacturer Part Number: AT24C32-10SC
• Description: 2-Wire Serial EEPROM
• Manufacturer: ATMEL [ATMEL Corporation]

Absolute Maximum Ratings*
Block Diagram
Pin Description
SERIAL CLOCK (SCL): The SCL input is used to positive
edge clock data into each EEPROM device and negative
edge clock data out of each device.
SERIAL DATA (SDA): The SDA pin is bidirectional for
serial data transfer. This pin is open-drain driven and may
be wire-ORed with any number of other open-drain or open
collector devices.
DEVICE/PAGE ADDRESSES (A2, A1, A0): The A2, A1
and A0 pins are device address inputs that are hard wired
or left not connected for hardware compatibility with
AT24C16. When the pins are hardwired, as many as eight
32K/64K devices may be addressed on a single bus sys-
tem (device addressing is discussed in detail under the
2
Operating Temperature .................................. -55 C to +125 C
Storage Temperature ..................................... -65 C to +150 C
Voltage on Any Pin
with Respect to Ground .....................................-1.0V to +7.0V
Maximum Operating Voltage........................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT24C32/64
Device Addressing section). When the pins are not hard-
wired, the default A
WRITE PROTECT (WP): The write protect input, when tied
to GND, allows normal write operations. When WP is tied
high to V
(8/16K bits) of memory are inhibited. If left unconnected,
WP is internally pulled down to GND.
Memory Organization
AT24C32/64, 32K/64K SERIAL EEPROM: The 32K/64K is
internally organized as 256 pages of 32 bytes each. Ran-
dom word addressing requires a 12/13 bit data word
address.
*NOTICE:
CC
, all write operations to the upper quandrant
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
2
, A
1
, and A
0
are zero.