74AUP1G38 NXP [NXP Semiconductors], 74AUP1G38 Datasheet - Page 9

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74AUP1G38

Manufacturer Part Number
74AUP1G38
Description
Low-power 2-input NAND gate (open drain)
Manufacturer
NXP [NXP Semiconductors]
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
74AUP1G38GF
Manufacturer:
NXP/恩智浦
Quantity:
20 000
NXP Semiconductors
Table 10.
[1]
74AUP1G38_3
Product data sheet
Supply voltage
V
0.8 V to 3.6 V
Fig 8.
CC
For measuring enable and disable times R
Test data is given in
Definitions for test circuit:
R
C
R
V
Load circuitry for switching times
EXT
L
L
T
Test data
= Load resistance.
= Load capacitance including jig and probe capacitance.
= Termination resistance should be equal to the output impedance Z
= External voltage for measuring switching times.
Load
C
5 pF, 10 pF, 15 pF and 30 pF
L
Table
10.
L
G
= 5 k , for measuring propagation delays, setup and hold times and pulse width R
V I
Rev. 03 — 22 June 2009
R T
R
5 k or 1 M
L
DUT
V
[1]
CC
V O
Low-power 2-input NAND gate (open drain)
C L
o
001aac521
of the pulse generator.
V
t
open
V
PLH
EXT
EXT
5 k
R L
, t
PHL
t
GND
PZH
74AUP1G38
, t
PHZ
© NXP B.V. 2009. All rights reserved.
t
2
PZL
V
, t
CC
PLZ
L
= 1 M .
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