MCP6V01-E/MD MICROCHIP [Microchip Technology], MCP6V01-E/MD Datasheet - Page 6

• Manufacturer Part Number: MCP6V01-E/MD
• Description: 300 ?A, Auto-Zeroed Op Amps
• Manufacturer: MICROCHIP [Microchip Technology]

MCP6V01/2/3
1.3
FIGURE 1-1:
FIGURE 1-2:
Time.
FIGURE 1-3:
FIGURE 1-4:
DS22058C-page 6
V
V
OUT
V
V
V
I
CS
I
I
V
OUT
DD
SS
CS
V
OS
DD
OS
IN
IN
1 µA
(typical)
-2 µA
(typical)
V
(typical)
Timing Diagrams
V
0V
DD
DD
High-Z
/5 MΩ
t
t
ODR
ON
1.8V
t
V
t
STL
STR
IL
Amplifier Start Up.
Offset Correction Settling
Output Overdrive Recovery.
Chip Select (MCP6V03).
V
DD
(typical)
(typical)
(typical)
300 µA
300 µA
/2
5 pA
V
SS
V
t
ODR
IH
1.8V to 5.5V
V
V
V
V
OS
OS
OS
OS
t
OFF
V
+ 50 µV
– 50 µV
+ 50 µV
+ 50 µV
DD
(typical)
(typical)
(typical)
High-Z
/5 MΩ
-2 µA
1 µA
1.4
The circuits used for the DC and AC tests are shown in
Figure 1-5
out as discussed in Section 4.3.8 “Supply Bypassing
and Filtering”. R
of R
FIGURE 1-5:
Most Non-Inverting Gain Conditions.
FIGURE 1-6:
Most Inverting Gain Conditions.
The circuit in
dynamic behavior (i.e., IMD, t
potentiometer balances the resistor network (V
should equal V
mode input voltage is V
input (V
10 V/V.
FIGURE 1-7:
Input Behavior.
V
V
V
V
V
DD
DD
IN
F
IN
IN
MCP6V0X
MCP6V0X
and R
/3
/3
20.0 kΩ
20.0 kΩ
ERR
0.1%
0.1%
Test Circuits
R
R
R
R
N
G
N
G
and
G
) appears at V
to minimize bias current effects.
Figure
Figure 1-7
REF
20.0 kΩ
MCP6V0X
20.0 kΩ
N
0.1%
0.1%
V
V
V
DD
DD
DD
is equal to the parallel combination
at DC). The op amp’s common
AC and DC Test Circuit for
AC and DC Test Circuit for
Test Circuit for Dynamic
100 nF
100 nF
100 nF
1-6. Lay the bypass capacitors
1 µF
© 2008 Microchip Technology Inc.
CM
R
R
25 turn
24.9 Ω
1 µF
1 µF
50Ω
F
F
tests the op amp input’s
OUT
= V
STR
IN
R
R
with a noise gain of
, t
/2. The error at the
ISO
ISO
R
STL
C
C
ISO
L
L
C
and t
L
V
REF
R
R
L
L
ODR
V
V
V
L
L
L
V
V
V
R
). The
OUT
OUT
OUT
L
OUT