AS1110 AMSCO [austriamicrosystems AG], AS1110 Datasheet - Page 18

• Manufacturer Part Number: AS1110
• Description: Constant-Current, 16-Channel LED Driver with Diagnostics
• Manufacturer: AMSCO [austriamicrosystems AG]

AS1110
Data Sheet - A p p l i c a t i o n I n f o r m a t i o n
The last pattern written into the shift register will be saved before starting low-current diagnosis mode and can be dis-
played immediately after the test has been performed.
Low-current diagnostic mode is started with 3 clock pulses during error detection mode. Then OEN should be enabled
for ≥2µs for testing. With the rising edge of OEN the LED test is stopped, and while LD is high the desired error mode
can be selected with the corresponding clock pulses. After LD and OEN go low again the previously saved pattern can
be displayed at the outputs.
With the next data input the detailed error code will be clocked out at pin SDO.
Note: See
Figure 20. Low-Current Diagnosis Mode with External Test Pattern – 64 Cascaded AS1110s
Cascading Devices
To cascade multiple AS1110 devices, pin SDO must be connected to pin SDI of the next AS1110
each rising edge of CLK the LSB of the shift register will be written into the shift register SDI of the next AS1110 in the
chain.
Note: When n*AS1110 devices are in one chain, n*16 clock pulses are needed to latch-in the input data.
Figure 21. Cascading AS1110 Devices
www.austriamicrosystems.com
Display
OEN
Current
CLK
LD
SDO
OEN
CLK
SDI
SDI
LD
Figure 20
SDI
T/O or S Error Code
External all 1s
Test Pattern
Data1
1024x
Data0
for use of an external test pattern.
AS1110 #1
CLK
≤ 100mA
LD
Low-Current
3x Clocks
OEN
Mode
SDO
≤ 0.8mA
SDI
Clock for Error
Mode 1x/2x
Rising Edge of OEN
Acquisition of Error Status
GEF
Low-Current Diagnosis Mode
AS1110 #2
CLK
Revision 1.00
Falling Edge of LD; Error Register
is copied into Shift Register
LD
O or S Error Code
from Test Pattern
Data2
1024x
OEN
SDO
≤ 100mA
GEF
SDI
GEF = Global Error Flag
AS1110 #n-1
CLK
Temperature Error Code
(see Figure
LD
Data2
1024x
Data3
OEN
SDO
21). At
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