CAT1161LI-25-GT3 CATALYST [Catalyst Semiconductor], CAT1161LI-25-GT3 Datasheet - Page 2

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CAT1161LI-25-GT3

Manufacturer Part Number
CAT1161LI-25-GT3
Description
Supervisory Circuits with I2C Serial CMOS EEPROM, Precision Reset Controller and Watchdog Timer (16K)
Manufacturer
CATALYST [Catalyst Semiconductor]
Datasheet
CAT1161, CAT1162
BLOCK DIAGRAM
ABSOLUTE MAXIMUM RATINGS
REABILITY CHARACTERISTICS
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) This parameter is tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
Doc. No. MD-3002 Rev. G
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground
V
Package Power Dissipation Capability (T
Lead Soldering Temperature (10 secs)
Output Short Circuit Current
Symbol
CC
I
N
V
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
voltage on output pins is V
LTH
T
END
ZAP
DR
EXTERNA L LOAD
V CC
GND
SDA
with Respect to Ground
WP
CAT1161
(4)(5)
Only for
(4)
(4)
(4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-up
START/STOP
WATCHDOG
CONTR OL
LOGIC
WORDADDRESS
LOGIC
RESET Controller
BUFFERS
D OUT
ACK
RESET RESET
Vcc Monitor
Precision
CC
+0.5V, which may overshoot to V
(3)
XDEC
(1)
SHIFT REGISTERS
DATA IN STORAGE
STATE COUNTERS
SLAVE
ADDRESS
COMPARATORS
TIMING CONTR OL
HIGHVOLTAGE/
SENSEAMPS
DECODERS
COLUMN
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
EEPROM
A
= 25°C)
16K
(2)
Reference Test Method
JEDEC Standard 17
CC
+2.0V for periods of less than 20 ns.
2
SCL
RESET THRESHOLD OPTION
Part Dash
Number
-45
-42
-30
-28
-25
1,000,000
2000
Min
100
100
CC
–2.0 to V
+1V.
–55 to +125
–65 to +150
Characteristics subject to change without notice
–2.0 to 7.0
Threshold
Minimum
Ratings
300
100
1.0
4.50
4.25
3.00
2.85
2.55
CC
Max
+ 2.0
© Catalyst Semiconductor, Inc.
Cycles/Byte
Threshold
Maximum
Years
Units
Volts
4.75
4.50
3.15
3.00
2.70
mA
Units
mA
ºC
ºC
ºC
W
V
V

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