SST39VF016 SST [Silicon Storage Technology, Inc], SST39VF016 Datasheet - Page 11

• Manufacturer Part Number: SST39VF016
• Description: 8 Mbit / 16 Mbit (x8) Multi-Purpose Flash
• Manufacturer: SST [Silicon Storage Technology, Inc]

8 Mbit / 16 Mbit Multi-Purpose Flash
SST39LF080 / SST39LF016 / SST39VF080 / SST39VF016
Data Sheet
TABLE 9: DC O
TABLE 10: R
TABLE 11: C
TABLE 12: R
©2001 Silicon Storage Technology, Inc.
Symbol
I
I
I
I
I
V
V
V
V
V
V
Symbol
T
T
Parameter
C
C
Symbol
N
T
I
DD
SB
ALP
LI
LO
LTH
PU-READ
PU-WRITE
DR
IL
ILC
IH
IHC
OL
OH
I/O
IN
END
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1
1
1
1
1
1
1
Parameter
Power Supply Current
Read
Program and Erase
Standby V
Auto Low Power
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input Low Voltage (CMOS)
Input High Voltage
Input High Voltage (CMOS)
Output Low Voltage
Output High Voltage
V
DD
ECOMMENDED
APACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
ELIABILITY
= 3.0-3.6V
PERATING
Parameter
Power-up to Read Operation
Power-up to Program/Erase Operation
Description
I/O Pin Capacitance
Input Capacitance
Parameter
Endurance
Data Retention
Latch Up
DD
Current
C
HARACTERISTICS
C
S
FOR
YSTEM
HARACTERISTICS
SST39LF080/016
P
OWER
-
UP
V
V
0.7V
DD
DD
Min
T
-0.3
-0.2
IMINGS
DD
Minimum Specification
AND
Limits
Max
0.8
0.3
0.2
15
20
20
20
10
11
2.7-3.6V
1
100 + I
10,000
Units
100
mA
mA
µA
µA
µA
µA
V
V
V
V
V
V
FOR
DD
Test Conditions
Address input=V
V
CE#=OE#=V
CE#=WE#=V
CE#=V
CE#=V
All inputs=V
V
V
V
V
V
V
I
I
OL
OH
SST39VF080/016
OUT
DD
IN
DD
DD
DD
DD
=100 µA, V
=GND to V
=-100 µA, V
=V
=V
=V
=V
=V
=GND to V
DD
DD
DD
DD
DD
IHC
ILC
Max
, V
Min
Max
Max
Max
, V
Units
IHC
Test Condition
Cycles
DD
Years
DD
IL
IL
mA
DD
DD
, WE#=V
, OE#=V
=V
Minimum
DD
=V
V
or V
V
DD
, V
IL
=V
I/O
IN
=V
DD
/V
DD
100
100
, V
DD
DD
= 0V
ILC
= 0V
IH
DD
Max
DD
Max
=V
, at f=1/T
Test Method
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
Min
WE#=V
IH
IH
=V
Min
DD
, all I/Os open
DD
Max
Max
IHC
RC
S71146-03-000 6/01
Min
Maximum
Units
12 pF
6 pF
µs
µs
T10.1 396
T11.0 396
T12.1 396
T9.2 396
396