hcts541ms Intersil Corporation, hcts541ms Datasheet - Page 6

• Manufacturer Part Number: hcts541ms
• Description: Rad-hard Non-inverting Octal Buffer/line Driver, Three-state
• Manufacturer: Intersil Corporation

NOTE: 1. Alternated Group A Inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
NOTE: 1. Except FN test which will be performed 100% Go/No-Go.
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
2. Each pin except VCC and GND will have a resistor of 680
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
CONFORMANCE
11 - 18
11 - 18
OPEN
CONFORMANCE GROUPS
GROUPS
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
Subgroup B-5
Subgroup B-6
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
11 - 18
GROUND
OPEN
1 - 10, 19
METHOD
10
10
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
5005
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCTS541MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
1/2 VCC = 3V 0.5V
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
1, 7, 9
11 - 18
GROUND
-
-
10
5% for static burn-in
5% for dynamic burn-in
687
TEST
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
VCC = 6V
POST RAD
2, 3, 8A, 8B, 10, 11
1 - 9, 19, 20
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
20
20
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
0.5V
VCC = 5V
1 - 9, 19, 20
5% for irradiation testing.
PRE RAD
0.5V
1, 9
50kHz
1, 19
READ AND RECORD
-
-
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
Subgroups 1, 2, 3, 9, 10, 11
OSCILLATOR
READ AND RECORD
Spec Number
Table 4 (Note 1)
POST RAD
25kHz
2 - 9
-
-
518630