hcts20ms Intersil Corporation, hcts20ms Datasheet - Page 4
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hcts20ms
Manufacturer Part Number
hcts20ms
Description
Rad-hard Dual 4-input Nand Gate
Manufacturer
Intersil Corporation
Datasheet
1.HCTS20MS.pdf
(8 pages)
NOTE:
NOTE:
1. Alternate group A inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
1. Except FN test which will be performed 100% Go/No-Go.
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
CONFORMANCE
CONFORMANCE GROUPS
GROUPS
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
ICC
IOL/IOH
Subgroup B-5
Subgroup B-6
METHOD
5005
PARAMETER
Specifications HCTS20MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
1, 7, 9
SUBGROUP
GROUP B
TEST
423
5
5
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
POST RAD
2, 3, 8A, 8B, 10, 11
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
-15% of 0 Hour
DELTA LIMIT
3µA
PRE RAD
1, 9
READ AND RECORD
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11
o
C)
READ AND RECORD
Spec Number
Table 4 (Note 1)
POST RAD
518619