msp430f2121irge Microchip Technology Inc., msp430f2121irge Datasheet - Page 3

• Manufacturer Part Number: msp430f2121irge
• Description: Msp430
• Manufacturer: Microchip Technology Inc.

† TDO or TDI is selected via JTAG instruction.
P1.0/TACLK
P1.1/TA0
P1.2/TA1
P1.3/TA2
P1.4/SMCLK/TCK
P1.5/TA0/TMS
P1.6/TA1/TDI/TCLK
P1.7/TA2/TDO/TDI †
P2.0/ACLK/CA2
P2.1/INCLK/CA3
P2.2/CAOUT/
TA0/CA4
P2.3/CA0/TA1
P2.4/CA1/TA2
P2.5/CA5
XIN/P2.6/CA6
XOUT/P2.7/CA7
RST/NMI
TEST
V CC
V SS
QFN Pad
NOTE: If XOUT/P2.7/CA7 is used as an input, excess current will flow until P2SEL.7 is cleared. This is due to the oscillator output driver
NAME
NAME
connection to this pad after reset.
DW, PW, or DGV
TERMINAL
NO.
NA
13
14
15
16
17
18
19
20
10
11
12
8
9
3
6
5
7
1
2
4
Package Pad
POST OFFICE BOX 655303
RGE
NO.
13
14
15
16
17
18
20
21
10
24
22
23
11
6
7
8
4
3
5
2
Terminal Functions
NA
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I
I
General-purpose digital I/O pin
Timer_A, clock signal TACLK input
General-purpose digital I/O pin
Timer_A, capture: CCI0A input, compare: Out0 output/BSL transmit
General-purpose digital I/O pin
Timer_A, capture: CCI1A input, compare: Out1 output
General-purpose digital I/O pin
Timer_A, capture: CCI2A input, compare: Out2 output
General-purpose digital I/O pin / SMCLK signal output
Test Clock input for device programming and test
General-purpose digital I/O pin / Timer_A, compare: Out0 output
Test Mode Select input for device programming and test
General-purpose digital I/O pin / Timer_A, compare: Out1 output
Test Data Input or Test Clock Input for programming and test
General-purpose digital I/O pin / Timer_A, compare: Out2 output
Test Data Output or Test Data Input for programming and test
General-purpose digital I/O pin / ACLK output
Comparator_A+, CA2 input
General-purpose digital I/O pin / Timer_A, clock signal at INCLK
Comparator_A+, CA3 input
General-purpose digital I/O pin
Timer_A, capture: CCI0B input/BSL receive
Comparator_A+, output / CA4 input
General-purpose digital I/O pin / Timer_A, compare: Out1 output
Comparator_A+, CA0 input
General-purpose digital I/O pin / Timer_A, compare: Out2 output
Comparator_A+, CA1 input
General-purpose digital I/O pin
Comparator_A+, CA5 input
Input terminal of crystal oscillator
General-purpose digital I/O pin
Comparator_A+, CA6 input
Output terminal of crystal oscillator
general-purpose digital I/O pin
Comparator_A+, CA7 input
Reset or nonmaskable interrupt input
Selects test mode for JTAG pins on Port1. The device protection fuse
is connected to TEST.
Supply voltage
Ground reference
QFN package pad connection to V SS recommended.
•
DALLAS, TEXAS 75265
MIXED SIGNAL MICROCONTROLLER
SLAS439C − SEPTEMBER 2004 − REVISED JULY 2006
DESCRIPTION
DESCRIPTION
MSP430x21x1
3