at27bv040 ATMEL Corporation, at27bv040 Datasheet - Page 3

• Manufacturer Part Number: at27bv040
• Description: At27bv040 4-megabit 512k X 8 Unregulated Battery-voltage High-speed Otp Eprom
• Manufacturer: ATMEL Corporation

3. Switching Considerations
4. Block Diagram
5. Absolute Maximum Ratings*
Note:
0346G–EPROM–12/07
Temperature Under Bias.................................. -40°C to +85°C
Storage Temperature ..................................... -65°C to +125°C
Voltage on Any Pin with
Respect to Ground .........................................-2.0V to +7.0V
Voltage on A9 with
Respect to Ground ......................................-2.0V to +14.0V
V
Respect to Ground .......................................-2.0V to +14.0V
PP
Supply Voltage with
1. Minimum voltage is -0.6V DC which may undershoot to -2.0V for pulses of less than 20 ns. Maximum output pin voltage is
V
overshoot to +7.0V for pulses of less than 20 ns.
CC
+ 0.75V DC which may be exceeded if certain precautions are observed (consult application notes) and which may
Switching between active and standby conditions via the Chip Enable pin may produce transient
voltage excursions. Unless accommodated by the system design, these transients may exceed
datasheet limits, resulting in device non-conformance. At a minimum, a 0.1 µF high frequency,
low inherent inductance, ceramic capacitor should be utilized for each device. This capacitor
should be connected between the V
device as possible. Additionally, to stabilize the supply voltage level on printed circuit boards
with large EPROM arrays, a 4.7 µF bulk electrolytic capacitor should be utilized, again con-
nected between the V
possible to the point where the power supply is connected to the array.
CC
and Ground terminals. This capacitor should be positioned as close as
(1)
(1)
(1)
*NOTICE:
CC
and Ground terminals of the device, as close to the
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability
AT27BV040
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