adc12041 National Semiconductor Corporation, adc12041 Datasheet - Page 8
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adc12041
Manufacturer Part Number
adc12041
Description
12-bit Plus Sign 216 Khz Sampling Analog-to-digital Converter
Manufacturer
National Semiconductor Corporation
Datasheet
1.ADC12041.pdf
(28 pages)
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Notes on Specifications
(Continued)
Note 17: The ADC12041’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will result in
±
a repeatability uncertainty of
0.20 LSB.
Note 18: Total Unadjusted Error (TUE) includes offset, full scale linearity and MUX errors.
Note 19: The ADC12041 parts used to gather the information for these curves were auto-calibrated prior to taking the measurements at each test condition. The
auto-calibration cycle cancels any first order drifts due to test conditions. However, each measurement has a repeatability uncertainty error of 0.2 LSB. See Note
17.
Note 20: The reference input current is a DC average current drawn by the reference input with a full-scale sinewave input. The ADC12041 is continuously con-
verting with a throughput rate of 206 kHz.
Note 21: These typical curves were measured during continuous conversions with a positive half-scale DC input. A 240 ns RD pulse was applied 25 ns after the
RDY signal went low. The data bus lines were loaded with 2 HC family CMOS inputs (C
20 pF).
L
Note 22: Any other values placed in the command field are meaningless. However, if a code of 101 or 110 is placed in the command field and the CS , RD and WR
go low at the same time, the ADC12041 will enter a test mode. These test modes are only to be used by the manufacturer of this device. A hardware power-off and
power-on reset must be done to get out of these test modes.
Electrical Characteristics
DS012441-5
FIGURE 1. Output Digital Code vs the Operating Input Voltage Range (General Case)
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