mc74lvxt4052 ON Semiconductor, mc74lvxt4052 Datasheet - Page 3

mc74lvxt4052

Manufacturer Part Number

mc74lvxt4052

Description

Analog Multiplexer Demultiplexer

Manufacturer

ON Semiconductor

Datasheet

1.MC74LVXT4052.pdf (14 pages)

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Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

1. Tested to EIA/JESD22−A114−A.

2. Tested to EIA/JESD22−A115−A.

3. Tested to JESD22−C101−A.

4. Tested to EIA/JESD78.

5. Unused inputs may not be left open. All inputs must be tied to a high−logic voltage level or a low−logic input voltage level.

RECOMMENDED OPERATING CONDITIONS

MAXIMUM RATINGS

DEVICE JUNCTION TEMPERATURE VERSUS

TIME TO 0.1% BOND FAILURES

Symbol

Temperature C

LATCHUP

MSL

STG

ESD

, t

Junction

100

110

120

130

140

Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î Î

Negative DC Supply Voltage

Positive DC Supply Voltage

Analog Input Voltage

Digital Input Voltage

DC Current, Into or Out of Any Pin

Storage Temperature Range

Lead Temperature, 1 mm from Case for 10 Seconds

Junction Temperature under Bias

Thermal Resistance

Power Dissipation in Still Air,

Moisture Sensitivity

Flammability Rating

ESD Withstand Voltage

Latchup Performance

Negative DC Supply Voltage

Positive DC Supply Voltage

Analog Input Voltage

Digital Input Voltage

Operating Temperature Range, All Package Types

Input Rise/Fall Time

(Channel Select or Enable Inputs)

Time, Hours

1,032,200

419,300

178,700

79,600

37,000

17,800

8,900

Time, Years

117.8

Parameter

47.9

20.4

9.4

4.2

2.0

1.0

Above V

MC74LVXT4052

http://onsemi.com

and Below GND at 125 C (Note 4)

Charged Device Model (Note 3)

(Note 5) (Referenced to GND)

Human Body Model (Note 1)

Figure 3. Failure Rate vs. Time Junction Temperature

Oxygen Index: 30% − 35%

Machine Model (Note 2)

(Referenced to GND)

(Referenced to V

= 3.0 V $ 0.3 V

= 5.0 V $ 0.5 V

FAILURE RATE OF PLASTIC = CERAMIC

UNTIL INTERMETALLICS OCCUR

TSSOP

SOIC

)

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TIME, YEARS

UL 94−V0 @ 0.125 in

Min

2.5

6.0

7.0 to )0.5

0.5 to )7.0

0.5 to V

65 to )150

Level 1

u2000

u1000

0.5 to 7.0

Value

)150

u200

$300

$20

Î Î Î Î

260

143

164

500

450

100

GND

Max

125

100

6.0

)0.5

Î Î Î

1000

Unit

ns/V

C/W

mc74lvxt4052 ON Semiconductor, mc74lvxt4052 Datasheet - Page 3

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