74hct2g00 NXP Semiconductors, 74hct2g00 Datasheet - Page 7

• Manufacturer Part Number: 74hct2g00
• Description: Dual 2-input Nand Gate
• Manufacturer: NXP Semiconductors

NXP Semiconductors
Table 10.
74HC_HCT2G00_4
Product data sheet
Type
74HC2G00
74HCT2G00
Fig 7.
Test data is given in
Definitions for test circuit:
R
C
R
S1 = Test selection switch.
Load circuit for measuring switching times
T
L
L
Test data
= Termination resistance should be equal to output impedance Z
= Load capacitance including jig and probe capacitance.
= Load resistance.
Input
V
V
3 V
I
CC
Table
negative
positive
10.
pulse
pulse
0 V
0 V
V
V
G
I
I
t
r
, t
6 ns
6 ns
90 %
10 %
f
V I
t
t
r
f
V
V
M
M
Rev. 04 — 3 July 2008
R T
10 %
90 %
Load
C
50 pF
50 pF
DUT
V
CC
L
t
t
W
W
V O
74HC2G00; 74HCT2G00
o
of the pulse generator.
V
V
M
M
C L
t
t
r
f
R L
S1
001aad983
R
1 k
1 k
V
L
CC
open
Dual 2-input NAND gate
S1 position
t
open
open
PHL
© NXP B.V. 2008. All rights reserved.
, t
PLH
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