nb4l52 ON Semiconductor, nb4l52 Datasheet - Page 3

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nb4l52

Manufacturer Part Number
nb4l52
Description
2.5 V/3.3 V/5.0 V Differential Data/clock D Flip-flop With Reset Multi-level Inputs To Lvpecl Translator W/ Internal Termination
Manufacturer
ON Semiconductor
Datasheet

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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
3. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
Table 4. MAXIMUM RATINGS
V
V
V
I
I
T
T
q
q
T
Symbol
IN
out
A
stg
JA
JC
sol
CC
EE
IO
Positive Power Supply
Negative Power Supply
Positive Input/Output
Negative Input/Output
Input Current Through R
Output Current
Operating Temperature Range
Storage Temperature Range
Thermal Resistance (Junction−to−Ambient)
Thermal Resistance (Junction−to−Case)
Wave Solder
Table 3. ATTRIBUTES
2. For additional information, see Application Note AND8003/D.
ESD Protection
Moisture Sensitivity (Note 2)
Flammability Rating Oxygen Index: 28 to 34
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
Parameter
T
(50 W Resistor)
Characteristic
Pb−Free
http://onsemi.com
V
V
V
V
Static
Surge
Continuous
Surge
0 LFPM
500 LFPM
2S2P (Note 3)
EE
CC
EE
CC
Condition 1
Charged Device Model
= 0 V
= 0 V
= 0 V
= 0 V
Human Body Model
3
Machine Model
QFN−16
V
V
16 QFN
16 QFN
16 QFN
I
I
v V
w V
Condition 2
CC
EE
Pb Pkg
Level 1
UL 94 V−0 @ 0.125 in
> 200 V
> 2 kV
> 1 kV
Value
164
Pb−Free Pkg
Level 1
−65 to +150
−40 to +85
Rating
−6.0
−6.0
265
6.0
6.0
4.0
45
80
25
50
42
35
°C/W
°C/W
°C/W
Unit
mA
mA
mA
mA
°C
°C
°C
V
V
V
V

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