mcf51qe32 Freescale Semiconductor, Inc, mcf51qe32 Datasheet - Page 34

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mcf51qe32

Manufacturer Part Number
mcf51qe32
Description
Mc9s08qe128 Flexis 8-bit Hcs08 Microcontrollers
Manufacturer
Freescale Semiconductor, Inc
Datasheet

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1
Electrical Characteristics
3.11.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell method in accordance
with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed with the microcontroller installed on a
custom EMC evaluation board while running specialized EMC test software. The radiated emissions from the microcontroller
are measured in a TEM cell in two package orientations (North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal to the reported
emissions levels.
3.11.2
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale test method. The
measurement is performed with the microcontroller installed on a custom EMC evaluation board and running specialized EMC
test software designed in compliance with the test method. The conducted susceptibility is determined by injecting the transient
susceptibility signal on each pin of the microcontroller. The transient waveform and injection methodology is based on IEC
61000-4-4 (EFT/B). The transient voltage required to cause performance degradation on any pin in the tested configuration is
greater than or equal to the reported levels unless otherwise indicated by footnotes below
1
34
Radiated emissions,
electric field
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results.
Data based on qualification test results. Not tested in production.
Parameter
Parameter
Radiated Emissions
Conducted Transient Susceptibility
MC9S08QE128 Series Advance Information Data Sheet, Rev. 4
V
Symbol
RE_TEM
Table 19. Radiated Emissions, Electric Field
Table 20. Conducted Susceptibility, EFT/B
V
Symbol
CS_EFT
package type
Conditions
V
T
A
DD
= +25
TBD
= TBD
package type
Conditions
o
V
T
C
A
DD
= +25
TBD
= TBD
500 – 1000 MHz
o
150 – 500 MHz
0.15 – 50 MHz
50 – 150 MHz
C
Frequency
SAE Level
IEC Level
TBD crystal
f
TBD bus
OSC
/f
BUS
TBD crystal
f
TBD bus
OSC
Result
Table
/f
A
B
C
D
BUS
20.
Freescale Semiconductor
Amplitude
(Min)
Level
TBD
TBD
TBD
TBD
(Max)
TBD
TBD
TBD
TBD
TBD
TBD
1
1
dBμV
Unit
Unit
kV

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