SST29EE010 Silicon Storage Technology, Inc., SST29EE010 Datasheet - Page 10

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SST29EE010

Manufacturer Part Number
SST29EE010
Description
1 Mbit 128k X8 Page-write Eeprom
Manufacturer
Silicon Storage Technology, Inc.
Datasheet

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Data Sheet
TABLE 7: Recommended System Power-up Timings
TABLE 8: Capacitance
TABLE 9: Reliability Characteristics
©2008 Silicon Storage Technology, Inc.
Symbol
T
T
Parameter
C
C
Symbol
N
T
I
LTH
PU-READ
PU-WRITE
DR
I/O
IN
END
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
1
1
1
1
1
1
1
Parameter
Power-up to Read Operation
Power-up to Write Operation
Description
I/O Pin Capacitance
Input Capacitance
Parameter
Endurance
Data Retention
Latch Up
(T
A
= 25°C, f=1 Mhz, other pins open)
Minimum Specification
10
10,000
100
100
1 Mbit Page-Write EEPROM
SST29EE010 / SST29VE010
Test Condition
Cycles
Units
Years
mA
Minimum
V
V
I/O
IN
100
5
= 0V
= 0V
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
Test Method
S71061-12-000
Maximum
Units
12 pF
6 pF
ms
µs
T7.1 1061
T8.0 1061
T9.5 1061
05/08

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