si3225 Silicon Laboratories, si3225 Datasheet - Page 5
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si3225
Manufacturer Part Number
si3225
Description
Dual Proslic Programmable Cmos Slic/codec
Manufacturer
Silicon Laboratories
Datasheet
1.SI3225.pdf
(112 pages)
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Table 1. Absolute Maximum Ratings and Thermal Information
High Battery Supply Voltage
Low Battery Supply Voltage
TIP or RING Voltage
TIP or RING Current
Thermal Information
Operating temperature (All devices)
Storage temperature (All devices)
Thermal Resistance (Si3220/Si3225)
Thermal Resistance (Si3200/Si3202)
Notes:
1. Permanent device damage may occur if the absolute maximum ratings are exceeded, and exposure to absolute
2. The PCB pad placed under the device package must be connected with multiple vias to the PCB ground layer and to
3. On Si3200 revision E, the dv/dt of the voltage applied to the V
4. Operation of the Si3220/Si3225 above 125 °C junction temperature may degrade device reliability. The Si3200/Si3202
5. The thermal resistance of an exposed pad package is assured when the recommended printed circuit board layout
maximum rating conditions for extended periods may affect device reliability. Functional operation should be restricted
to the conditions as specified in the operational sections of this data sheet.
the GND1-GND4 pins via short traces. The TQFP-64 e-Pad must be properly soldered to the PCB pad during PCB
assembly. This type of low-impedance grounding arrangement is necessary to ensure that maximum differentials are
not exceeded under any operating condition in addition to providing thermal dissipation.
should be operated at a junction temperature below 140 °C for optimal reliability.
guidelines are followed correctly. The specified performance requires that the exposed pad be soldered to an exposed
copper surface of equal size and that multiple vias are added to enable heat transfer between the top-side copper
surface and a large internal copper ground plane. Refer to “AN55: Dual ProSLIC
evaluation board data sheet for specific layout examples.
Parameter
4
5
5
Rev. 1.3
I
Symbol
TIP
V
V
V
V
V
θ
θ
BATH
RING
, I
BATL
BAT
TIP
JA
JA
RING
,
,
BAT
, V
Test Condition
TQFP-64 ePad
SOIC-16 ePad
Pulse < 10 us
BATH
Pulse < 4 us
Si3220/25 Si3200/02
Continuous
Continuous
Continuous
10 ms
1
, and V
(Continued)
BATL
®
User Guide” or to the Si3220/3225
pins must be limited to 10 V/µs.
V
V
BATH
BATH
V
–130
–135
–130
–100
Min
–40
–40
BATH
25 (typical)
55 (typical)
–15
–35
+100
+100
+150
Max
0.4
0.4
0.4
0.4
0.4
0.4
°C/W
°C/W
Unit
mA
°C
°C
V
V
V
V
V
V
5