LT6654 Linear Technology, LT6654 Datasheet - Page 3

• Manufacturer Part Number: LT6654
• Description: SOT-23 Precision Wide Supply High Output Drive Voltage Reference
• Manufacturer: Linear Technology

ELECTRICAL CHARACTERISTICS
temperature range, otherwise specifi cations are at T
Load Regulation (Note 4)
Minimum Operating Voltage (Note 5)
Supply Current
Output Short-Circuit Current
Output Voltage Noise (Note 6)
Turn-On Time
Long-Term Drift of Output Voltage (Note 7)
Hysteresis (Note 8)
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: If the parts are stored outside of the specifi ed temperature range,
the output may shift due to hysteresis.
Note 3: Temperature coeffi cient is measured by dividing the maximum
change in output voltage by the specifi ed temperature range.
Note 4: Load regulation is measured on a pulse basis from no load to the
specifi ed load current. Output changes due to die temperature change
must be taken into account separately.
Note 5: Excludes load regulation errors.
Note 6: Peak-to-peak noise is measured with a 3-pole highpass at 0.1Hz
and 4-pole lowpass fi lter at 10Hz. The unit is enclosed in a still-air
environment to eliminate thermocouple effects on the leads. The test
time is 10 seconds. RMS noise is measured on a spectrum analyzer in
a shielded environment where the intrinsic noise of the instrument is
removed to determine the actual noise of the device.
I
I
V
No Load
Short V
Short V
0.1Hz ≤ f ≤ 10Hz
10Hz ≤ f ≤ 1kHz
0.1% Settling, C
ΔT = 0°C to 70°C
ΔT = –40°C to 85°C
ΔT = –40°C to 125°C
OUT(SOURCE)
OUT(SINK)
IN
– V
I
I
I
OUT
OUT(SOURCE)
OUT(SINK)
OUT
OUT
OUT
A
= 0mA
= 25°C, C
= 10mA
, ΔV
to GND
to V
= 10mA
The
= –10mA
OUT
IN
LOAD
= 10mA
= 0.1%
l
L
= 1μF
denotes the specifi cations which apply over the full operating
= 1μF and V
Note 7: Long-term stability typically has a logarithmic characteristic
and therefore, changes after 1000 hours tend to be much smaller than
before that time. Total drift in the second thousand hours is normally less
than one third that of the fi rst thousand hours with a continuing trend
toward reduced drift with time. Long-term stability will also be affected by
differential stresses between the IC and the board material created during
board assembly.
Note 8: Hysteresis in output voltage is created by package stress that
differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. Hysteresis measures the maximum output change for the
averages of three hot or cold temperature cycles. For instruments that
are stored at well controlled temperatures (within 20 or 30 degrees of
operational temperature), it’s usually not a dominant error source.
Note 9: The stated temperature is typical for soldering of the leads during
manual rework. For detailed IR refl ow recommendations, refer to the
Applications Information section.
IN
= V
OUT
l
l
l
l
l
l
+ 0.5V, unless otherwise noted.
350
120
1.6
1.8
55
40
30
60
30
40
90
3
9
100
120
450
550
15
20
30
50
8
LT6654
ppm/√kHr
ppm/mA
ppm/mA
ppm/mA
ppm/mA
ppm
ppm
3
ppm
ppm
ppm
6654f
RMS
mV
mV
mV
mV
mA
mA
P-P
μA
μA
μs