IMX29F002 Macronix International, IMX29F002 Datasheet - Page 18

• Manufacturer Part Number: IMX29F002
• Description: 2M-BIT [256K x 8] CMOS FLASH MEMORY
• Manufacturer: Macronix International

AC CHARACTERISTICS
TEST CONDITIONS:
• Input pulse levels: 0.45V/2.4V for 70ns max., 0V/3V for 55ns
• Input rise and fall times: < 10ns for 70ns max.
• Output load:
• Reference levels for measuring timing: 0.8V, 2.0V for 70ns
READ TIMING WAVEFORMS
P/N: PM0547
1 TTL gate + 100pF (Including scope and jig) for 70ns max.
1 TTL gate + 50pF (Including scope and jig) for 55ns speed
grade
SYMBOL
tACC
tCE
tOE
tDF
tOH
SYMBOL
tACC
tCE
tOE
tDF
tOH
A0~17
Q0~7
DATA
WE
OE
CE
PARAMETER
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float
Address to Output hold
PARAMETER
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float
Address to Output hold
VOH
VOL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
< 5ns for 55ns
HIGH Z
(
(
: 1.5V for 55ns
Note1)
Note1)
max.
MIN.
0
0
MIN.
0
0
29F002T/B-55
29F002T/B-90
tACC
18
MAX.
55
55
25
20
MAX.
90
90
40
30
NOTE:
1. tDF is defined as the time at which the output achieves the
tCE
ADD Valid
open circuit condition and data is no longer driven.
tOE
MX29F002/002N
29F002T/B-70
MIN.
0
0
29F002T/B-12
MIN.
0
0
DATA Valid
70
120
MAX.
70
30
20
MAX.
120
50
30
tOH
tDF
ns
ns
UNIT
ns
ns
ns
ns
UNIT
ns
ns
ns
ns
REV. 1.1, JUN. 14, 2001
CONDITION
CE=OE=VIL
OE=VIL
CE=VIL
CE=VIL
CE=OE=VIL
CONDITIONS
CE=OE=VIL
OE=VIL
CE=VIL
CE=VIL
CE=OE=VIL
HIGH Z