MC74HCT541A ON Semiconductor, MC74HCT541A Datasheet - Page 3

• Manufacturer Part Number: MC74HCT541A
• Description: Octal 3-State Non-Inverting Buffer/Line Driver/Line Receiver With LSTTL-Compatible Inputs
• Manufacturer: ON Semiconductor

NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
* Used to determine the no–load dynamic power consumption: P D = C PD V CC 2 f + I CC V CC . For load considerations, see Chapter 2 of the
AC CHARACTERISTICS
OUTPUT Y
ON Semiconductor High–Speed CMOS Data Book (DL129/D).
t PLH ,
t PHL
t PLZ ,
t PHZ
t PZL ,
t PZH
t TLH ,
t THL
C in
C out
Symbol
INPUT A
C PD
t PLH
t r
Semiconductor High–Speed CMOS Data Book (DL129/D).
*Includes all probe and jig capacitance
t TLH
Power Dissipation Capacitance (Per Buffer)*
Maximum Propagation Delay, Input A to Output Y
(Figures 1 and 3)
Maximum Propagation Delay, Output Enable to Output Y
(Figures 2 and 4)
Maximum Propagation Delay, Output Enable to Output Y
(Figures 2 and 4)
Maximum Output Transition Time, Any Output
(Figures 1 and 3)
Maximum Input Capacitance
Maximum Three–State Output Capacitance (Output in High Impedance
State)
10%
DEVICE
UNDER
10%
1.3V
TEST
1.3V
90%
Figure 3.
Figure 1.
(V CC = 5.0V, C L = 50 pF, Input t r = t f = 6 ns)
OUTPUT
90%
POINT
TEST
C L *
Parameter
t f
t PHL
SWITCHING WAVEFORMS
t THL
TEST CIRCUITS
http://onsemi.com
MC74HCT541A
3.0V
GND
OE1 or OE2
OUTPUT Y
OUTPUT Y
3
DEVICE
UNDER
TEST
*Includes all probe and jig capacitance
OUTPUT
1.3V
–55 to 25 C
1.3V
1.3V
POINT
TEST
Typical @ 25 C, V CC = 5.0 V
23
30
30
12
10
15
t PZL
t PZH
C L *
Figure 4.
Figure 2.
1k
Guaranteed Limit
t PHZ
t PLZ
85 C
55
28
34
34
15
10
15
1.3V
CONNECT TO V CC WHEN
TESTING t PLZ AND t PZL .
CONNECT TO GND WHEN
TESTING t PHZ and t PZH .
10%
90%
125 C
32
38
38
18
10
15
3.0V
GND
HIGH
IMPEDANCE
V OL
V OH
HIGH
IMPEDANCE
Unit
pF
pF
pF
ns
ns
ns
ns