MC33926 Freescale Semiconductor, MC33926 Datasheet - Page 5

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MC33926

Manufacturer Part Number
MC33926
Description
5.0 A Throttle Control H-Bridge
Manufacturer
Freescale Semiconductor
Datasheet

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Table 2. Maximum Ratings
permanent damage to the device. These parameters are not production tested.
Analog Integrated Circuit Device Data
Freescale Semiconductor
ELECTRICAL RATINGS
THERMAL RATINGS
Notes
Power Supply Voltage
Logic Input Voltage
SF
Continuous Output Current
ESD Voltage
Storage Temperature
Operating Temperature
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
1.
2.
3.
4.
5.
6.
Normal Operation (Steady-State)
Transient Overvoltage
Human Body Model
Machine Model
Charge Device Model
Ambient
Junction
Output
Device will survive repetitive transient overvoltage conditions for durations not to exceed 500 ms
External protection is required to prevent device damage in case of a reverse battery condition.
Exceeding the maximum input voltage on IN1, IN2, EN, INV, SLEW, D1, or
device.
Exceeding the pullup resistor voltage on the open drain
Continuous output current capability is dependent on sufficient package heatsinking to keep junction temperature ≤ 150
ESD1 testing is performed in accordance with the Human Body Model (C
accordance with the Machine Model (C
The limiting factor is junction temperature, taking into account the power dissipation, thermal resistance, and heat sinking provided. Brief
non-repetitive excursions of junction temperature above 150
maximum. (Non-repetitive events are defined as not occurring more than once in 24 hours.)
Corner Pins (1,9,17,25)
All Other Pins
OUT1 and OUT2 to GND
All Other Pins
(3)
(5)
(2)
(6)
(1)
(4)
Ratings
ELECTRICAL CHARACTERISTICS
ZAP
= 200 pF, R
MAXIMUM RATINGS
ZAP
SF
pin may cause permanent damage to the device.
= 0 Ω), and the Charge Device Model (CDM), Robotic (C
°
C can be tolerated provided the duration does not exceed 30 seconds
ZAP
D2
I
= 100 pF, R
V
OUT(CONT)
may cause a malfunction or permanent damage to the
Symbol
V
PWR(SS)
V
V
T
PWR(t)
V
V
ESD1
ESD2
T
STG
T
SF
IN
A
J
ZAP
= 1500 Ω), ESD2 testing is performed in
@
ELECTRICAL CHARACTERISTICS
duty cycle not to exceed 10%.
- 0.3 to 7.0
- 0.3 to 7.0
- 65 to 150
- 40 to 125
- 40 to 150
- 0.3 to 28
- 0.3 to 40
± 2000
Value
±500
± 200
±750
±500
5.0
MAXIMUM RATINGS
ZAP
°
C.
= 4.0pF).
Unit
°
°
V
V
V
A
V
C
C
33926
5

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