IDT70824 Integrated Device Technology, IDT70824 Datasheet - Page 6

• Manufacturer Part Number: IDT70824
• Description: 4k X 16 Saram? Sequential Access / Random Access Memory
• Manufacturer: Integrated Device Technology

Data Retention Power Down/Up Waveform (Random and Sequential Port)
NOTES :
1. SCE is synchronized to the sequential clock input.
2. CMD > V
AC Test Conditions
SCLK
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
Output Load
SCE
IDT70824S/L
High-Speed 4K x 16 Sequential Access Random Access Memory
V
CE
I
CC
CC
CC
- 0.2V.
DATA
Figure 1. AC Output Test Load
OUT
V
347Ω
I
SB
IH
t
CDR
4.5V
t
PD
Figures 1,2 and 3
GND to 3.0V
5V
3ns Max.
3099 drw 05
1.5V
1.5V
DATA RETENTION MODE
893Ω
30pF
3099 tbl 10
V
DR
V
DR
≥
2V
6
Figure 2. Output Test Load (for t
tAA/tCD/tEB
(Typical, ns)
DATA
Figure 3. Lumped Capacitance Load Typical Derating Curve
OUT
-1
-2
-3
8
7
6
5
4
3
2
1
347Ω
t
OHZ
Military and Commercial Temperature Ranges
(*Including scope and jig.)
,t
4.5V
20 40 60 80 100 120 140 160 180 200
WHZ
, t
t
CKHZ
R
5V
, and t
CAPACITANCE (pF)
V
CLZ
3099 drw 06
IH
893Ω
, t
5pF*
CKLZ
BLZ
t
PU
, t
)
OLZ
I
SB
, t
CHZ
10pF is the I/O
capacitance of
this device, and
30pF is the AC
Test Load
capacitance.
, t
BHZ
3099 drw 04
,
3099 drw 07
(1,2)
,