TC126 Microchip Technology, TC126 Datasheet - Page 2

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TC126

Manufacturer Part Number
TC126
Description
(TC125) PFM Step-Up DC/DC Regulators
Manufacturer
Microchip Technology
Datasheet

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0
TC125/TC126
1.0
Absolute Maximum Ratings*
Voltage on V
LX Sink Current ............................................ 400mA pk
Power Dissipation.............................................150mW
Operating Temperature Range............. -40°C to +85°C
Storage Temperature Range .............. -40°C to +125°C
TC125/TC126 ELECTRICAL SPECIFICATIONS
DS21372B-page 2
Electrical Characteristics: V
V
V
V
I
I
I
I
R
I
D
f
VLX
η
V
V
II
II
Note
DD
NL
STBY
SHDN
LX
MAX
Symbol
N
N
OUT
DD
START
IH
IL
LX(ON)
CYCLE
H
L
LIM
....................................................... -0.3V to +12V
1:
2:
3:
4:
ELECTRICAL
CHARACTERISTICS
Output Voltage
Operating Supply Voltage
Start-Up Supply Voltage
Operating Supply Current
TC125
TC125/126
TC125/126
No Load Supply Current
Standby Supply Current
Shutdown Supply Current
LX Pin ON Resistance
LX Pin Leakage Current
Duty Cycle
Maximum Oscillator Frequency
LX Pin Limit Voltage
Efficiency
SHDN Input Logic High
SHDN Input Logic Low
SHDN Input Current (High)
SHDN Pin Input Current (Low)
V
V
V
The V
The V
R
IN
DD
DD
is the factory output voltage setting.
= V
input tied to SENSE input for TC126, as shown in Figure 3-2.
, SENSE/V
PS
DD
OUT
input of the TC125 must be operated between 2.0V and 10.0V for spec compliance.
input of the TC126 must be operated between 2.2V and 10.0V for spec compliance.
x 0.95.
Parameter
DD
IN
, LX, SHDN Pins
= V
OUT
x 0.6, T
A
= 25°C, SHDN = V
V
R
-0.25
0.70
0.75
Min
– 2.5%
0.7
70
85
V
R
0.80
Typ
100
± 0.5%
OUT
14
20
32
10
75
70
80
85
5
5
6
2
3
3
6
3
*Stresses above those listed under "Absolute Maximum
Ratings" may cause permanent damage to the device. These
are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the
operation sections of the specifications is not implied.
Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability.
(TC125), unless otherwise noted.
V
R
Max
10.0
0.90
0.20
0.25
+ 2.5%
115
0.5
1.1
28
40
64
10
14
11
80
9
4
5
5
8
5
1
Units
kHz
µA
µA
µA
µA
µA
µA
µA
%
%
V
V
V
V
V
V
©
Note 4
I
(Note 2)
V
V
V
I
V
SHDN = V
V
(Note 2), (Note 3)
No external components,
V
Measured at LX pin (Note 2)
Note 2
Note 2
V
V
V
OUT
OUT
2002 Microchip Technology Inc.
OUT
OUT
OUT
OUT
OUT
OUT
OUT
IN
LX
= V
= 0.4V, V
= 1mA
= 0, V
= 2V, I
= 3V, I
= 5V, I
= V
= 2V
= 3V
= 5V
OUT
Test Conditions
V
V
LX
OUT
OUT
OUT
IL
+ 0.5V, V
V
V
, (Note 2)
OUT
OUT
OUT
= 10V
OUT
OUT
OUT
= 2V
= 3V
= 5V
= 10mA
= 30mA
= 50mA
= 2V
= 3V
= 5V
V
V
IN
IN
IN
= 2V
= 3V
= 5V

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