ISL43L122 Intersil Corporation, ISL43L122 Datasheet - Page 6

• Manufacturer Part Number: ISL43L122
• Description: (ISL43L120 - ISL43L122) Dual SPST Analog Switches
• Manufacturer: Intersil Corporation

Test Circuits and Waveforms
Detailed Description
The ISL43L12X family of devices are bidirectional, single
pole/single throw (SPST) analog switches that offer precise
switching capability from a single 1.65V to 3.6V supply with
low on-resistance (0.16Ω) and high speed operation
(t
suited for portable battery powered equipment due to its low
operating supply voltage (1.65V), low power consumption
(2.7µW max), low leakage currents (80nA max), and the tiny
TDFN and MSOP packaging. The ultra low on-resistance and
R
application that require signal reproduction.
ON
SIGNAL
GENERATOR
ON
SIGNAL
GENERATOR
ANALYZER
ANALYZER
= 13ns, t
flatness provide very low insertion loss and distortion to
FIGURE 3. OFF ISOLATION TEST CIRCUIT
FIGURE 5. CROSSTALK TEST CIRCUIT
OFF
R
R
0V or V+
L
L
= 13ns). The device is especially well
NO1 or NC1
COM2
IN
NO or NC
COM
1
6
GND
GND
NO2 or NC2
COM1
V+
V+
ISL43L120, ISL43L121, ISL43L122
IN
IN
(Continued)
2
X
C
0V or V+
C
0V or V+
50Ω
NC
Supply Sequencing and Overvoltage Protection
With any CMOS device, proper power supply sequencing is
required to protect the device from excessive input currents
which might permanently damage the IC. All I/O pins contain
ESD protection diodes from the pin to V+ and to GND (see
Figure 7). To prevent forward biasing these diodes, V+ must
be applied before any input signals, and the input signal
voltages must remain between V+ and GND. If these
conditions cannot be guaranteed, then one of the following
two protection methods should be employed.
Logic inputs can easily be protected by adding a 1kΩ
resistor in series with the input (see Figure 7). The resistor
limits the input current below the threshold that produces
permanent damage, and the sub-microamp input current
produces an insignificant voltage drop during normal
operation.
IMPEDANCE
ANALYZER
V
NX
R
ON
FIGURE 6. CAPACITANCE TEST CIRCUIT
1mA
= V
1
/100mA
FIGURE 4. R
V
1
NO or NC
COM
ON
NO or NC
COM
TEST CIRCUIT
GND
GND
V+
IN
V+
IN
X
C
0V or V+
C
0V or V+
June 23, 2006
FN6091.2