MC10E141 ON Semiconductor, MC10E141 Datasheet - Page 5

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MC10E141

Manufacturer Part Number
MC10E141
Description
8-BIT SHIFT REGISTER
Manufacturer
ON Semiconductor
Datasheet

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NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
9. 10 Series: V
10. Within-device skew is defined as identical transitions on similar paths through a device.
Table 9. AC CHARACTERISTICS
f
t
PHL
t
t
t
t
t
t
t
t
Symbol
SHIFT
PLH
s
h
RR
PW
SKEW
JITTER
r
f
100 Series: V
t
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
Max. Shift Frequency
Propagation Delay To Output
Setup Time
Hold Time
Reset Recovery Time
Minimum Pulse Width
Within-Device Skew (Note 10)
Random Clock Jitter (RMS)
Rise/Fall Times
EE
EE
(20 - 80%)
can vary −0.46 V / +0.06 V.
can vary −0.46 V / +0.8 V.
Characteristic
V
CCx
Clk, MR
= 5.0 V; V
SEL0
SEL1
SEL0
SEL1
MR
Clk
D
D
EE
Min
700
625
600
175
350
300
200
100
100
900
400
300
http://onsemi.com
= 0.0 V or V
− 200
−150
− 25
0°C
Typ
900
750
725
200
150
700
525
< 1
25
60
5
CCx
Max
975
975
800
= 0.0 V; V
Min
700
625
600
175
350
300
200
100
100
900
400
300
EE
= −5.0 V (Note 9)
− 200
25°C
−150
− 25
Typ
900
750
725
200
150
700
525
< 1
25
60
Max
975
975
800
Min
700
625
600
175
350
300
200
100
100
900
400
300
− 200
85°C
−150
− 25
Typ
900
750
725
150
700
525
200
< 1
25
60
Max
975
975
800
MHz
Unit
ps
ps
ps
ps
ps
ps
ps
ps

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