MC10E107 ON Semiconductor, MC10E107 Datasheet - Page 5

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MC10E107

Manufacturer Part Number
MC10E107
Description
QUINT 2-INPUT XOR/XNOR GATE
Manufacturer
ON Semiconductor
Datasheet

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NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
9. 10 Series: V
10. Within-device skew is defined as identical transitions on similar paths through a device.
Table 8. AC CHARACTERISTICS
Symbol
f
t
t
t
t
t
t
MAX
PLH
PHL
SKEW
JITTER
r
f
100 Series: V
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
Maximum Toggle Frequency
Propagation Delay to Output
Within-Device Skew (Note 10)
Random Clock Jitter (RMS)
Rise/Fall Time
(20 - 80%)
EE
EE
can vary −0.46 V / +0.06 V.
can vary −0.46 V / +0.8 V.
Characteristic
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
Figure 3. Typical Termination for Output Driver and Device Evaluation
Driver
Device
V
Q
Q
CCx
= 5.0 V; V
D to Q
D to Q
D to F
Q
F
EE
Min
250
500
275
300
Z
Z
http://onsemi.com
= 0.0 V or V
o
o
= 50 W
= 50 W
−40°C
Typ
700
410
725
450
475
< 1
75
50 W
V
5
TT
CCx
= V
1000
Max
600
700
700
= 0.0 V; V
V
CC
TT
− 2.0 V
50 W
Min
250
500
275
300
EE
= −5.0 V (Note 9)
25°C
Typ
700
410
725
450
475
< 1
75
D
D
1000
Max
600
700
700
Receiver
Device
Min
250
500
275
300
85°C
Typ
700
410
725
450
475
< 1
75
1000
Max
600
700
700
MHz
Unit
ps
ps
ps
ps

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