MC100EP142 ON Semiconductor, MC100EP142 Datasheet - Page 5

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MC100EP142

Manufacturer Part Number
MC100EP142
Description
ECL 9-Bit Shift Register
Manufacturer
ON Semiconductor
Datasheet

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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 4. MAXIMUM RATINGS
V
V
V
I
T
T
q
q
q
q
T
Symbol
out
A
stg
JA
JC
JA
JC
sol
CC
EE
I
Positive Power Supply
Negative Power Supply
PECL Mode Input Voltage
NECL Mode Input Voltage
Output Current
Operating Temperature Range
Storage Temperature Range
Thermal Resistance (Junction−to−Ambient)
Thermal Resistance (Junction−to−Case)
Thermal Resistance (Junction−to−Ambient)
Thermal Resistance (Junction−to−Case)
Wave Solder
Table 3. ATTRIBUTES
Moisture Sensitivity (Note 3)
3. For additional information, refer to Application Note AND8003/D.
Internal Input Pulldown Resistor
Internal Input Pullup Resistor
ESD Protection
Flammability Rating
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
Parameter
Characteristics
Pb−Free
Oxygen Index: 28 to 34
Pb
http://onsemi.com
V
V
V
V
Continuous
Surge
0 lfpm
500 lfpm
Standard Board
0 lfpm
500 lfpm
2S2P
v3 sec @ 248°C
v3 sec @ 260°C
EE
CC
EE
CC
Condition 1
Charged Device Model
= 0 V
= 0 V
= 0 V
= 0 V
Human Body Model
5
Machine Model
LQFP
QFN
(R1)
(R2)
V
V
LQFP−32
LQFP−32
LQFP−32
QFN−32
QFN−32
QFN−32
I
I
v V
w V
Condition 2
CC
EE
UL−94 V−0 @ 0.125 in
405 Devices
37.5 kW
> 100 V
Level 2
Level 1
> 2 kV
> 2 kV
75 kW
Value
−65 to +150
−40 to +85
12 to 17
Rating
100
265
265
−8
−6
50
80
55
31
27
12
8
6
°C/W
°C/W
°C/W
°C/W
Unit
mA
°C
°C
°C
V
V
V

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