S-801 Seiko Instruments, S-801 Datasheet - Page 12

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S-801

Manufacturer Part Number
S-801
Description
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR
Manufacturer
Seiko Instruments
Datasheet

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*1. −V
*2. Temperature change ratio for the detection voltage [mV/°C] is calculated using the following equation.
12
Detection voltage
Hysteresis width
Current
consumption
Operating voltage
Output current
Leakage current
Detection voltage
temperature
coefficient
Delay time 1
Delay time 2
Input voltage
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
S-801 Series
www.DataSheet4U.com
detection voltage range in Table 1 to 2.)
Electrical Characteristics
Δ
Δ
*1. Temperature change ratio of the detection voltage
*2. Specified detection voltage value
*3. Detection voltage temperature coefficient
DET
Ta
V
Item
DET
: Actual detection voltage value, −V
*2
[
mV/
*1
°
C
Δ
]
*1
Ta
Δ
Symbol
=
−V
V
I
V
I
V
V
LEAK
I
OUT
t
t
HYS
V
SS
D1
D2
DD
SH
SL
DET
V
DET
V
DET(S)
DET
(
V
V
V
Output transistor,
Nch, V
Only for CMOS output
products,
Output transistor,
Pch, V
Only for Nch open-drain output products,
Output transistor,
Nch, V
V
V
DS pin, V
DS pin, V
Typ.
DD
DD
DD
DD
DD
=3.5 V
=4.5 V
=6.5 V
=−V
=−V
) [ ]
DD
OUT
DD
V
DET
DET
–V
=10.0 V, V
2 *
DD
DD
=0.5 V
+1 V, DS pin Low
+1 V, DS pin High
OUT
=6.0 V
=6.0 V
×
Ta=−40 °C to +85 °C
Seiko Instruments Inc.
DET(S)
Δ
=0.5 V
Ta
Δ
Condition
OUT
: Specified detection voltage value (The center value of the
V
DET
Table 6
V
=10.0 V
DET
[
ppm/
S-80122 to 26
S-80127 to 39
S-80140 to 60
V
S-80122 to 60
V
S-80127 to 60
V
S-80122 to 39
V
S-80140 to 54
V
S-80155 to 60
S-801xxAx
S-801xxBx
S-801xxCx
DD
DD
DD
DD
DD
°
C
=1.2 V
=2.4 V
=4.8 V
=6.0 V
=8.4 V
]
3 *
÷
1000
(Ta=25 °C Unless otherwise specified)
−V
×0.98
0.95
0.75
1.25
32.5
Min.
130
110
3.0
1.0
1.5
1.0
30
65
DET(S)
−V
±120
Typ.
100
200
220
1.3
1.5
1.8
1.5
6.0
2.0
2.5
3.0
60
50
DET(S)
−V
×1.02
Max.
±360
10.0
72.5
100
145
290
330
3.3
3.5
4.0
0.1
0.3
DET(S)
Rev.3.3
ppm/
Unit
mV
mA
ms
μA
μA
°C
μs
V
V
V
circuit
Test
_00
1
2
1
3
4

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